›› 2014, Vol. 23 ›› Issue (7): 77504-077504.doi: 10.1088/1674-1056/23/7/077504
• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇 下一篇
肖仁政a, 张早娣a, Vasiliy O. Pelenovichb, 王泽松a, 张瑞a, 李慧a, 刘雍a, 黄志宏a, 付德君a
Xiao Ren-Zheng (肖仁政)a, Zhang Zao-Di (张早娣)a, Vasiliy O. Pelenovichb, Wang Ze-Song (王泽松)a, Zhang Rui (张瑞)a, Li Hui (李慧)a, Liu Yong (刘雍)a, Huang Zhi-Hong (黄志宏)a, Fu De-Jun (付德君)a
摘要: Crystalline BiFeO3 (BFO) films each with a crystal structure of a distorted rhombohedral perovskite are characterized by X-ray diffraction (XRD) and high-resolution electron microscopy (HRTEM). The diffusion of silicon atoms from the substrate into the BiFeO3 film is detected by Rutherford backscattering spectrometry (RBS). The element analysis is performed by energy dispersive X-ray spectroscopy (EDS). Simulation results of RBS spectrum show a visualized distribution of silicon. X-ray photoelectron spectroscopy (XPS) indicates that a portion of silica is formed in the diffusion process of silicon atoms. Ferroelectric and weak ferromagnetic properties of the BFO films are degraded due to the diffusion of silicon atoms. The saturation magnetization decreases from 6.11 down to 0.75 emu/g, and the leakage current density increases from 3.8 × 10-4 up to 7.1 × 10-4 A/cm-2.
中图分类号: (Ferrimagnetics)