中国物理B ›› 2013, Vol. 22 ›› Issue (1): 14206-014206.doi: 10.1088/1674-1056/22/1/014206

• ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS • 上一篇    下一篇

Power dissipation in oxide-confined 980-nm vertical-cavity surface-emitting lasers

史国柱, 关宝璐, 李硕, 王强, 沈光地   

  1. Key Laboratory of Opto-electronics Technology of Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • 收稿日期:2012-05-21 修回日期:2012-06-13 出版日期:2012-12-01 发布日期:2012-12-01
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 60908012 and 61076148) and the Foundation of Beijing Municipal Education Commission, China (Grant No. KM201010005030).

Power dissipation in oxide-confined 980-nm vertical-cavity surface-emitting lasers

Shi Guo-Zhu (史国柱), Guan Bao-Lu (关宝璐), Li Shuo (李硕), Wang Qiang (王强), Shen Guang-Di (沈光地)   

  1. Key Laboratory of Opto-electronics Technology of Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • Received:2012-05-21 Revised:2012-06-13 Online:2012-12-01 Published:2012-12-01
  • Contact: Guan Bao-Lu E-mail:gbl@bjut.edu.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 60908012 and 61076148) and the Foundation of Beijing Municipal Education Commission, China (Grant No. KM201010005030).

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摘要： We presented 980-nm oxide-confined vertical-cavity surface-emitting lasers (VCSELs) with 16-μm oxide aperture. Optical power, voltage, and emission wavelength are measured in an ambient temperature range of 5-80 ℃. Measurements combined with an empirical model are used to analyse the power dissipation in device and the physical mechanism contributing to the thermal rollover phenomenon in VCSEL. It is found that the carrier leakage induced self-heating in active region and the Joule heating caused by the series resistance are the main sources of the power dissipation. In addition, carrier leakage induced self-heating increases as injection current increases, resulting in a rapid decrease of the internal quantum efficiency, which is a dominant contribution to the thermal rollover of the VCSEL at larger current. Our study provides useful guideline to design 980-nm oxide-confined VCSEL for thermal performance enhancement.

关键词: vertical-cavity surface-emitting lasers, power dissipation, thermal rollover

Abstract: We presented 980-nm oxide-confined vertical-cavity surface-emitting lasers (VCSELs) with 16-μm oxide aperture. Optical power, voltage, and emission wavelength are measured in an ambient temperature range of 5 ℃-80 ℃. Measurements combined with an empirical model are used to analyse the power dissipation in device and the physical mechanism contributing to the thermal rollover phenomenon in VCSEL. It is found that the carrier leakage induced self-heating in active region and the Joule heating caused by the series resistance are the main sources of the power dissipation. In addition, carrier leakage induced self-heating increases as injection current increases, resulting in a rapid decrease of the internal quantum efficiency, which is a dominant contribution to the thermal rollover of the VCSEL at larger current. Our study provides useful guideline to design 980-nm oxide-confined VCSEL for thermal performance enhancement.

Key words: vertical-cavity surface-emitting lasers, power dissipation, thermal rollover

中图分类号:  (Semiconductor lasers; laser diodes)

  • 42.55.Px
42.60.Lh (Efficiency, stability, gain, and other operational parameters) 42.72.Ai (Infrared sources)