中国物理B ›› 2011, Vol. 20 ›› Issue (2): 20701-020701.doi: 10.1088/1674-1056/20/2/020701

• • 上一篇    下一篇

Exact calculation of the minimal thickness of the large optical path difference wind imaging interferometer

张淳民, 艾晶晶, 任文艺   

  1. School of Science, Xi'an Jiaotong University, Xi'an 710049, China MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, Xi'an Jiaotong University, Xi'an 710049, China
  • 收稿日期:2010-05-17 修回日期:2010-09-13 出版日期:2011-02-15 发布日期:2011-02-15
  • 基金资助:
    Project supported by the Key Program of the National Natural Science Foundation of China (Grant No. 40537031), the National Natural Science Foundation of China (Grant No. 40875013), the National Defense Basic Scientific Research Program of China (Grant No. A1420080187), the National High Technology Research and Development Program of China (Grant No. 2006AA12Z152), and Xianyang Normal University Research Fund (Grant No. 06XSYK268).

Exact calculation of the minimal thickness of the large optical path difference wind imaging interferometer

Zhang Chun-Min(张淳民)†, Ai Jing-Jing(艾晶晶), and Ren Wen-Yi(任文艺)   

  1. School of Science, Xi'an Jiaotong University, Xi'an 710049, China; MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, Xi'an Jiaotong University, Xi'an 710049, China
  • Received:2010-05-17 Revised:2010-09-13 Online:2011-02-15 Published:2011-02-15
  • Supported by:
    Project supported by the Key Program of the National Natural Science Foundation of China (Grant No. 40537031), the National Natural Science Foundation of China (Grant No. 40875013), the National Defense Basic Scientific Research Program of China (Grant No. A1420080187), the National High Technology Research and Development Program of China (Grant No. 2006AA12Z152), and Xianyang Normal University Research Fund (Grant No. 06XSYK268).

PDF (PC)

640

赞

摘要： This paper gives the relation between spatial ray and its projection on paper plane based on the vector form of reflective law. Using the method of prism expansion, it obtains the exact expression of the exit height. The exit height can ensure that the incident rays, at arbitrary direction and arbitrary angle, after several transmission and reflection in the two right-angle reflectors, finally pass through the exit surface. Furthermore, it analyses the effects of different parameters on the exit height through computer simulation, and some important conclusions are obtained. The physical meaning of the sign of exit height is described, and the exact expression of the minimal thickness of the large optical path difference wind imaging interferometer is gained. This work is of great scientific significance to the static, real-time simultaneous detection of atmospheric wind field, and it will provide a theoretical and practical guidance for the miniaturization design and engineering realization of wind imaging interferometer.

关键词: wind imaging interferometer, thickness, reflective law of vector form, prism expansion

Abstract: This paper gives the relation between spatial ray and its projection on paper plane based on the vector form of reflective law. Using the method of prism expansion, it obtains the exact expression of the exit height. The exit height can ensure that the incident rays, at arbitrary direction and arbitrary angle, after several transmission and reflection in the two right-angle reflectors, finally pass through the exit surface. Furthermore, it analyses the effects of different parameters on the exit height through computer simulation, and some important conclusions are obtained. The physical meaning of the sign of exit height is described, and the exact expression of the minimal thickness of the large optical path difference wind imaging interferometer is gained. This work is of great scientific significance to the static, real-time simultaneous detection of atmospheric wind field, and it will provide a theoretical and practical guidance for the miniaturization design and engineering realization of wind imaging interferometer.

Key words: wind imaging interferometer, thickness, reflective law of vector form, prism expansion

中图分类号:  (Optical instruments and equipment)

  • 07.60.-j
07.60.Rd (Visible and ultraviolet spectrometers) 42.15.Eq (Optical system design)