中国物理B ›› 2010, Vol. 19 ›› Issue (9): 97806-097806.doi: 10.1088/1674-1056/19/9/097806

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Mechanism and enhancement of photoluminescence from silicon nanocrystals implanted in SiO2 matrix

吴志永, 刘克新, 任晓堂   

  1. State Key Laboratory of Nuclear Physics and Technology, Institute of Heavy Ion Physics, Peking University, Beijing 100871, China
  • 收稿日期:2010-01-04 修回日期:2010-04-26 出版日期:2010-09-15 发布日期:2010-09-15

Mechanism and enhancement of photoluminescence from silicon nanocrystals implanted in SiO2 matrix

Wu Zhi-Yong(吴志永), Liu Ke-Xin(刘克新), and Ren Xiao-Tang(任晓堂)   

  1. State Key Laboratory of Nuclear Physics and Technology, Institute of Heavy Ion Physics, Peking University, Beijing 100871, China
  • Received:2010-01-04 Revised:2010-04-26 Online:2010-09-15 Published:2010-09-15

摘要: Photoluminescence (PL) spectra of Si nanocrystals (NCs) prepared by 130 keV Si ions implantation onto SiO2 matrix were investigated as a function of annealing temperature and implanted ion dose. PL spectra consist of two PL peaks, originated from smaller Si NCs due to quantum confinement effect (QCE) and the interface states located at the surface of larger Si NCs. The evolution of number of dangling bonds (DBs) on Si NCs was also investigated. For hydrogen-passivated samples, a monotonic increase in PL peak intensity with the dose of implanted Si ions up to 3× 1017 ions /cm2 is observed. The number of DBs on individual Si NC, the interaction between DBs at the surface of neighbouring Si NCs and their effects on the efficiency of PL are discussed.

Abstract: Photoluminescence (PL) spectra of Si nanocrystals (NCs) prepared by 130 keV Si ions implantation onto SiO2 matrix were investigated as a function of annealing temperature and implanted ion dose. PL spectra consist of two PL peaks, originated from smaller Si NCs due to quantum confinement effect (QCE) and the interface states located at the surface of larger Si NCs. The evolution of number of dangling bonds (DBs) on Si NCs was also investigated. For hydrogen-passivated samples, a monotonic increase in PL peak intensity with the dose of implanted Si ions up to 3× 1017 ions /cm2 is observed. The number of DBs on individual Si NC, the interaction between DBs at the surface of neighbouring Si NCs and their effects on the efficiency of PL are discussed.

Key words: ion implantation, nanocrystals, photoluminescence, dangling bond

中图分类号: 

  • 7865