Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer

doi:10.1088/1674-1056/19/3/034201

中国物理B ›› 2010, Vol. 19 ›› Issue (3): 34201-034201.doi: 10.1088/1674-1056/19/3/034201

Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer

张淳民¹, 吴俊芳²

(1)School of Science, Xi'an Jiaotong University, Xi'an 710049, China; (2)School of Science, Xi'an Jiaotong University, Xi'an 710049, China;School of Science, Xi'an Polytechnic University, Xi'an 710048, China

收稿日期:2009-02-06 出版日期:2010-03-15 发布日期:2010-03-15
基金资助:
Project supported by the State Key Program of National Natural Science of China (Grant No.~40537031), National High Technology Research and Development Program of China (Grant No.~2006AA12Z152), the National Natural Science Foundation of China (Grant Nos.~40875013, 40375010 and 60278019), the Science and Technology Plan Foundation of Shaanxi Province, China (Grant No.~2005K04-G18).

Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer

Wu Jun-Fang(吴俊芳)^a)b) and Zhang Chun-Min(张淳民)^a)†

^a School of Science, Xi'an Jiaotong University, Xi'an 710049, China; ^b School of Science, Xi'an Polytechnic University, Xi'an 710048, China

Received:2009-02-06 Online:2010-03-15 Published:2010-03-15
Supported by:
Project supported by the State Key Program of National Natural Science of China (Grant No.~40537031), National High Technology Research and Development Program of China (Grant No.~2006AA12Z152), the National Natural Science Foundation of China (Grant Nos.~40875013, 40375010 and 60278019), the Science and Technology Plan Foundation of Shaanxi Province, China (Grant No.~2005K04-G18).

摘要/Abstract

摘要： The static large field of the view polarization interference imaging spectrometer is based on the modified Savart polariscope. There appears a dispersion between the ordinary ray and extraordinary ray when light passes through the modified Savart polariscope. The dispersion greatly influences the intensities and the results of the interferogram and target image in the static large field of the view polarization interference imaging spectrometer. At the same time, the incident angle determines the dispersion. When the light goes through the modified Savart polariscope, the dispersion occurs in the left plate, the half-wave plate and the right plate of the modified Savart polariscope. Using the extension of Snell's law, the dispersion in the crystal is theoretically calculated and numerically simulated separately. The relationship curve between incident angle and the dispersion is obtained by simulation.

Abstract: The static large field of the view polarization interference imaging spectrometer is based on the modified Savart polariscope. There appears a dispersion between the ordinary ray and extraordinary ray when light passes through the modified Savart polariscope. The dispersion greatly influences the intensities and the results of the interferogram and target image in the static large field of the view polarization interference imaging spectrometer. At the same time, the incident angle determines the dispersion. When the light goes through the modified Savart polariscope, the dispersion occurs in the left plate, the half-wave plate and the right plate of the modified Savart polariscope. Using the extension of Snell's law, the dispersion in the crystal is theoretically calculated and numerically simulated separately. The relationship curve between incident angle and the dispersion is obtained by simulation.

Key words: imaging spectroscopy, dispersion, the modified Savart polariscope

中图分类号: (Polarimeters and ellipsometers)

07.60.Fs

42.30.-d (Imaging and optical processing) 02.60.Cb (Numerical simulation; solution of equations)

吴俊芳, 张淳民. Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer[J]. 中国物理B, 2010, 19(3): 34201-034201.

Wu Jun-Fang(吴俊芳) and Zhang Chun-Min(张淳民). Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer[J]. Chin. Phys. B, 2010, 19(3): 34201-034201.

参考文献 15

[1]	Zhang C M, Xiang L B and Zhao B C In: 2000Lessard R A and Lampropoulos G A (eds). Applications of Photonic Technology 4 Proc. SPIE 4087 957
[2]	Zhang C M, Xiang L B and Zhao B C 2004 J. Opt. A: Pure Appl. Opt . 6 1
[3]	Zhang C M, Xiang L B and Zhao B C 2002 Opt. Commun . 203 21
[4]	Zhang C M, Zhao B C and Xiang L B 2003 Opt. Commun. 227 221
[5]	Zhang C M Static Polarization Interference Imaging Spectrometer Chinese Patent 01213109.1, 27 February 2002
[6]	Zhang C M, Zhao B C and Xiang L B 2004 Appl. Opt . 43 6090
[7]	Francon M and Mallick S 1971 Polarized Interferometer (New York: Wiley) pp24--25, pp139--140
[8]	Wu J F, Zhang C M, Zhang Y T, Liu H C and Zhai X J 2008 Chin. Phys. B 17 2504
[9]	Wu J F, Zhang C M, Yue R H and Li R L 2005 Commun. Theor. 43 687
[10]	Wu J F and Liu H C 2009 Acta Opt. Sin. 29 93 (in Chinese)
[11]	Wu J F and Zhang C M 2009 Sci. China Ser. G 52 1003
[12]	Wu J F, Sun M Z and Zhang C M 2009 Acta Phys. Sin. 58 3844 (in Chinese)
[13]	Wu J F and Zhang C M Optik
	[http://dx.doi.org/10.1016/j.ijleo.2009.05.005.
[14]	Zhang C M, Zhao B C, Yuan Z L and Huang W J 2009 J. Opt. A: Pure Appl Opt . 11 085401
[15]	Wu J F and Liu H C 2009 Proc. SPIE 7279 72790R-1

Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer

Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer

PDF (PC)

赞

可视化

摘要/Abstract

引用本文

使用本文

参考文献 15

相关文章 12

Metrics

本文评价

推荐阅读 0

[1]	郜小勇, 陈超, 张飒. Optical properties of aluminum-doped zinc oxide films deposited by direct-current pulse magnetron reactive sputtering[J]. 中国物理B, 2014, 23(3): 30701-030701.
[2]	Sofyan A. Taya, Taher M. El-Agez, Anas A. Alkanoo. Rotating polarizer, compensator, and analyzer ellipsometry[J]. Chin. Phys. B, 2013, 22(12): 120703-120703.
[3]	Sofyan A. Taya, Taher M. El-Agez, Anas A. Alkanoo . Ellipsometric configurations using a phase retarder and rotating polarizer and analyzer at any speed ratio[J]. 中国物理B, 2012, 21(11): 110701-110701.
[4]	张继涛, 吴学健, 李岩. Mixed polarization in determining the film thickness of a silicon sphere by spectroscopic ellipsometry[J]. 中国物理B, 2012, 21(1): 10701-010701.
[5]	章启贤, 魏文生, 阮方平. Ellipsometric analysis and optical absorption characterization of gallium phosphide nanoparticulate thin film[J]. 中国物理B, 2011, 20(4): 47802-047802.
[6]	王旭, 陆珩, 戴俊, 温娟, 原昆, 吕惠宾, 金奎娟, 周岳亮, 杨国桢. Real-time and label-free detection of biomolecular interactions by oblique-incidence reflectivity difference method[J]. 中国物理B, 2011, 20(1): 10704-010704.
[7]	吴海英, 张淳民, 李杰. A simple and effective model for Jones matrix to evaluate the transmission performance of Savart polariscope[J]. 中国物理B, 2010, 19(11): 114201-114203.
[8]	张淳民, 任文艺, 穆廷魁. Effects of optical axis direction on optical path difference and lateral displacement of Savart polariscope[J]. 中国物理B, 2010, 19(2): 24202-024202.
[9]	吴俊芳, 张淳民, 张英堂, 刘汉臣, 翟学军. Refraction of extraordinary rays and ordinary rays in the Savart polariscope[J]. 中国物理B, 2008, 17(7): 2504-2508.
[10]	丁海兵, 庞文宁, 刘义保, 尚仁成. Passive magnetic shielded spin polarized electron source with optical electron polarimeter[J]. 中国物理B, 2007, 16(1): 51-57.
[11]	丁海兵, 庞文宁, 刘义保, 尚仁成. Experimental study on helium optical electron polarimetry[J]. 中国物理B, 2005, 14(12): 2440-2443.
[12]	阮存军, 庞文宁, 高君芳, 尚仁成. Study on optical electron polarimeter and measurement of the relative Stokes parameters of weak light[J]. 中国物理B, 2002, 11(2): 126-131.