中国物理B ›› 1995, Vol. 4 ›› Issue (4): 301-310.doi: 10.1088/1004-423X/4/4/009

• • 上一篇    

THE ELECTRON-BEAM IRRADIATION ON THE HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS: A NUMERICAL SIMULATION OF THE LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY

冯一军, 程其恒, 吴培亨   

  1. Department of Information Physics, Nanjing University, Nanjing 210008, China
  • 收稿日期:1994-05-26 出版日期:1995-04-20 发布日期:1995-04-20
  • 基金资助:
    Project supported by the National Natural Science Foundation of China and by the National Center for Research and Development on Superconductivity of China.

THE ELECTRON-BEAM IRRADIATION ON THE HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS: A NUMERICAL SIMULATION OF THE LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY

FENG YI-JUN (冯一军), CHENG QI-HENG (程其恒), WU PEI-HENG (吴培亨)   

  1. Department of Information Physics, Nanjing University, Nanjing 210008, China
  • Received:1994-05-26 Online:1995-04-20 Published:1995-04-20
  • Supported by:
    Project supported by the National Natural Science Foundation of China and by the National Center for Research and Development on Superconductivity of China.

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摘要： Low-temperature scanning electron microscopy (LTSEM) is a promising measuring technique for probing the spatial distribution of the superconducting properties of the high-temperature superconducting (HTS) thin films. A theoretical analysis of the electron-beam irradiation on the HTS thin films in the LTSEM has been carried out. An inhomogeneously distributed grain array model has been applied in the analysis, and some numerical sim-ulations have been carried out on the electron-beam induced voltage (EIV) signals in the LTSEM experiments. The comparisons of our numerical results with the LTSEM experi-mental data indicate that it is quite reasonable to use a two-dimensional Josephson junction array for stimulating the inhomogeneous HTS thin film sample. Our numerical results also show that the EIV signals are influenced by the electron-beam power used in the LTSEM, and a reduction of the electron-beam power is suggested in order to eliminate the errors in estimating the local values of critical temperature Tc and critical current Ic by the sample temperature and the bias current at which the first EIV signal occurs.

Abstract: Low-temperature scanning electron microscopy (LTSEM) is a promising measuring technique for probing the spatial distribution of the superconducting properties of the high-temperature superconducting (HTS) thin films. A theoretical analysis of the electron-beam irradiation on the HTS thin films in the LTSEM has been carried out. An inhomogeneously distributed grain array model has been applied in the analysis, and some numerical sim-ulations have been carried out on the electron-beam induced voltage (EIV) signals in the LTSEM experiments. The comparisons of our numerical results with the LTSEM experi-mental data indicate that it is quite reasonable to use a two-dimensional Josephson junction array for stimulating the inhomogeneous HTS thin film sample. Our numerical results also show that the EIV signals are influenced by the electron-beam power used in the LTSEM, and a reduction of the electron-beam power is suggested in order to eliminate the errors in estimating the local values of critical temperature Tc and critical current Ic by the sample temperature and the bias current at which the first EIV signal occurs.

中图分类号: 

  • 74.78.Bz
74.25.Sv (Critical currents) 61.80.Fe (Electron and positron radiation effects) 74.50.+r (Tunneling phenomena; Josephson effects) 74.10.+v (Occurrence, potential candidates) 68.37.Hk (Scanning electron microscopy (SEM) (including EBIC))