中国物理B ›› 1993, Vol. 2 ›› Issue (1): 65-71.doi: 10.1088/1004-423X/2/1/009

• • 上一篇    

Li ION BACKSCATTERING STUDY ON HIGH-Tc YBaCuO AND GdBaCuO SUPERCONDUCTOR FILMS

江伟林, 郑宗爽, 朱沛然   

  1. Laboratory of Ion Beams, Institute of Physics, Academia Sinica, Beijing 100080, China
  • 收稿日期:1992-03-18 出版日期:1993-01-20 发布日期:1993-01-20

Li ION BACKSCATTERING STUDY ON HIGH-Tc YBaCuO AND GdBaCuO SUPERCONDUCTOR FILMS

JIANG WEI-LIN (江伟林), ZHENG ZONG-SHUANG (郑宗爽), ZHU PEI-RAN (朱沛然)   

  1. Laboratory of Ion Beams, Institute of Physics, Academia Sinica, Beijing 100080, China
  • Received:1992-03-18 Online:1993-01-20 Published:1993-01-20

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摘要： Rutherford backscattering (RBS) measurements of 4.2 MeV Li and 2.4 MeV He ions were done for YBaCuO and GdBaCuO high-Tc, superconductor films deposited on MgO and SrTiO3 single crystalline substrates and for their bulk samples. Energy spectra of both ions were calculated using the RBS analysis program rewritten by the authors. Comparisons between these two non-destructive tech-niques showed some advantages in analyzing the layer thickness and composition ratios of those thin films by MeV Li ions backscattering. Estimated errors are within 7 % for the measured elemental con-centrations and l0 % for the layer thickness in our experiments. A brief discussion is also made of the results.

Abstract: Rutherford backscattering (RBS) measurements of 4.2 MeV Li and 2.4 MeV He ions were done for YBaCuO and GdBaCuO high-Tc, superconductor films deposited on MgO and SrTiO3 single crystalline substrates and for their bulk samples. Energy spectra of both ions were calculated using the RBS analysis program rewritten by the authors. Comparisons between these two non-destructive tech-niques showed some advantages in analyzing the layer thickness and composition ratios of those thin films by MeV Li ions backscattering. Estimated errors are within 7 % for the measured elemental con-centrations and l0 % for the layer thickness in our experiments. A brief discussion is also made of the results.

中图分类号: 

  • 74.78.Bz
82.80.Yc (Rutherford backscattering (RBS), and other methods ofchemical analysis)