Optical and electrical characterizations of nanoparticle Cu2S thin films

doi:10.1088/1674-1056/23/4/046803

中国物理B ›› 2014, Vol. 23 ›› Issue (4): 46803-046803.doi: 10.1088/1674-1056/23/4/046803

• CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES • 上一篇下一篇

Optical and electrical characterizations of nanoparticle Cu₂S thin films

M.Saadeldin^a, H.S.Soliman^b, H.A.M.Ali^b, K.Sawaby^a

a Physics Department, Faculty of Science, Cairo University, Giza 12613, Egypt;
b Physics Department, Faculty of Education, Ain-Shams University, Cairo 11757, Egypt

收稿日期:2013-06-22 修回日期:2013-09-10 出版日期:2014-04-15 发布日期:2014-04-15

Optical and electrical characterizations of nanoparticle Cu₂S thin films

M. Saadeldin^a, H. S. Soliman^b, H. A. M. Ali^b, K. Sawaby^a

a Physics Department, Faculty of Science, Cairo University, Giza 12613, Egypt;
b Physics Department, Faculty of Education, Ain-Shams University, Cairo 11757, Egypt

Received:2013-06-22 Revised:2013-09-10 Online:2014-04-15 Published:2014-04-15
Contact: K.Sawaby E-mail:phy_kamel@yahoo.com
About author:68.35.bg

摘要/Abstract

摘要： Copper sulfide thin films are deposited onto different substrates at room temperature using the thermal evaporation technique. X-ray diffraction spectra show that the film has an orthorhombicchalcocite (γ-Cu₂S) phase. The atomic force microscopy images indicate that the film exhibits nanoparticles with an average size of nearly 44 nm. Specrtophotometric measurements for the transmittance and reflectance are carried out at normal incidence in a spectral wavelength range of 450 nm-2500 nm. The refractive index, n, as well as the absorption index, k is calculated. Some dispersion parameters are determined. The analyses of ε₁ and ε₂ reveal several absorption peaks. The analysis of the spectral behavior of the absorption coefficient, α, in the absorption region reveals direct and indirect allowed transitions. The dark electrical resistivity is studied as a function of film thickness and temperature. Tellier's model is adopted for determining the mean free path and bulk resistance.

关键词: physical properties of Cu₂S thermal evaporation, nanoparticle Cu₂S thin films

Abstract: Copper sulfide thin films are deposited onto different substrates at room temperature using the thermal evaporation technique. X-ray diffraction spectra show that the film has an orthorhombicchalcocite (γ-Cu₂S) phase. The atomic force microscopy images indicate that the film exhibits nanoparticles with an average size of nearly 44 nm. Specrtophotometric measurements for the transmittance and reflectance are carried out at normal incidence in a spectral wavelength range of 450 nm-2500 nm. The refractive index, n, as well as the absorption index, k is calculated. Some dispersion parameters are determined. The analyses of ε₁ and ε₂ reveal several absorption peaks. The analysis of the spectral behavior of the absorption coefficient, α, in the absorption region reveals direct and indirect allowed transitions. The dark electrical resistivity is studied as a function of film thickness and temperature. Tellier's model is adopted for determining the mean free path and bulk resistance.

Key words: physical properties of Cu₂S thermal evaporation, nanoparticle Cu₂S thin films

中图分类号: (Semiconductors)

68.35.bg

M.Saadeldin, H.S.Soliman, H.A.M.Ali, K.Sawaby. Optical and electrical characterizations of nanoparticle Cu₂S thin films[J]. 中国物理B, 2014, 23(4): 46803-046803.

M. Saadeldin, H. S. Soliman, H. A. M. Ali, K. Sawaby. Optical and electrical characterizations of nanoparticle Cu₂S thin films[J]. Chin. Phys. B, 2014, 23(4): 46803-046803.

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Optical and electrical characterizations of nanoparticle Cu₂S thin films

Optical and electrical characterizations of nanoparticle Cu₂S thin films

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