Optically tuned dielectric characteristics of SrTiO3/Si thin film in the terahertz range

doi:10.1088/1674-1056/ac04a7

中国物理B ›› 2021, Vol. 30 ›› Issue (10): 107802-107802.doi: 10.1088/1674-1056/ac04a7

Optically tuned dielectric characteristics of SrTiO₃/Si thin film in the terahertz range

Bin Zou(邹斌)^1,3, Qing-Qing Li(李晴晴)^1,2, Yu-Ping Yang(杨玉平)^1,3,†, and Hai-Zhong Guo(郭海中)^2,4,‡

1 School of Science, Minzu University of China, Beijing 100081, China;
2 School of Physics and Microelectronics, Zhengzhou University, Zhengzhou 450052, China;
3 Optoelectronics Research Center, Minzu University of China, Beijing 100081, China;
4 Collaborative Innovation Center of Light Manipulations and Applications, Shandong Normal University, Jinan 250358, China

收稿日期:2021-03-19 修回日期:2021-05-04 接受日期:2021-05-25 出版日期:2021-09-17 发布日期:2021-09-17
通讯作者: Yu-Ping Yang, Hai-Zhong Guo E-mail:ypyang@muc.edu.cn;hguo@zzu.edu.cn
基金资助:
Project supported by the National Natural Science Foundation of China (Grant No. 62075248), the National Key R&D Program of China (Grant Nos. 2017YFB0405400 and 2020YFB2009300), and the Program for the Innovation Team of Science and Technology in University of Henan, China (Grant No. 20IRTSTHN014).

Optically tuned dielectric characteristics of SrTiO₃/Si thin film in the terahertz range

Bin Zou(邹斌)^1,3, Qing-Qing Li(李晴晴)^1,2, Yu-Ping Yang(杨玉平)^1,3,†, and Hai-Zhong Guo(郭海中)^2,4,‡

1 School of Science, Minzu University of China, Beijing 100081, China;
2 School of Physics and Microelectronics, Zhengzhou University, Zhengzhou 450052, China;
3 Optoelectronics Research Center, Minzu University of China, Beijing 100081, China;
4 Collaborative Innovation Center of Light Manipulations and Applications, Shandong Normal University, Jinan 250358, China

Received:2021-03-19 Revised:2021-05-04 Accepted:2021-05-25 Online:2021-09-17 Published:2021-09-17
Contact: Yu-Ping Yang, Hai-Zhong Guo E-mail:ypyang@muc.edu.cn;hguo@zzu.edu.cn
Supported by:
Project supported by the National Natural Science Foundation of China (Grant No. 62075248), the National Key R&D Program of China (Grant Nos. 2017YFB0405400 and 2020YFB2009300), and the Program for the Innovation Team of Science and Technology in University of Henan, China (Grant No. 20IRTSTHN014).

摘要/Abstract

摘要： Active control of the optical parameters in strontium titanate (SrTiO₃, STO) thin films is highly desirable for tunable terahertz (THz) integrated devices such as filters, phase modulators, and electro-optical devices. In this work, optically tuned dielectric parameters of a STO thin film epitaxially grown on a silicon wafer were characterized in the THz region with an 800 nm laser pump-THz detection system. The refractive index, extinction coefficient, and complex dielectric constant of the STO thin film were calculated using thin-film parameter extraction. Owing to carrier transportation and soft-mode oscillation, the above optical parameters changed notably with the pump power of the external laser. This study is of great significance for rapid and non-contact THz phase-modulation technology and may serve as a powerful tool to tune the dielectric properties of the STO thin films.

关键词: terahertz spectroscopy, optical constants, STO/Si film

Abstract: Active control of the optical parameters in strontium titanate (SrTiO₃, STO) thin films is highly desirable for tunable terahertz (THz) integrated devices such as filters, phase modulators, and electro-optical devices. In this work, optically tuned dielectric parameters of a STO thin film epitaxially grown on a silicon wafer were characterized in the THz region with an 800 nm laser pump-THz detection system. The refractive index, extinction coefficient, and complex dielectric constant of the STO thin film were calculated using thin-film parameter extraction. Owing to carrier transportation and soft-mode oscillation, the above optical parameters changed notably with the pump power of the external laser. This study is of great significance for rapid and non-contact THz phase-modulation technology and may serve as a powerful tool to tune the dielectric properties of the STO thin films.

Key words: terahertz spectroscopy, optical constants, STO/Si film

中图分类号: (Coherent nonlinear optical spectroscopy)

78.47.jh

78.20.Ci (Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)) 78.66.-w (Optical properties of specific thin films)

Bin Zou(邹斌), Qing-Qing Li(李晴晴), Yu-Ping Yang(杨玉平), and Hai-Zhong Guo(郭海中). Optically tuned dielectric characteristics of SrTiO₃/Si thin film in the terahertz range[J]. 中国物理B, 2021, 30(10): 107802-107802.

Bin Zou(邹斌), Qing-Qing Li(李晴晴), Yu-Ping Yang(杨玉平), and Hai-Zhong Guo(郭海中). Optically tuned dielectric characteristics of SrTiO₃/Si thin film in the terahertz range[J]. Chin. Phys. B, 2021, 30(10): 107802-107802.

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Optically tuned dielectric characteristics of SrTiO₃/Si thin film in the terahertz range

Optically tuned dielectric characteristics of SrTiO₃/Si thin film in the terahertz range

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