中国物理B ›› 2020, Vol. 29 ›› Issue (7): 77303-077303.doi: 10.1088/1674-1056/ab8a35
• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇 下一篇
Shuyan Zhao(赵舒燕), Yuxin Song(宋禹忻), Hao Liang(梁好), Tingting Jin(金婷婷), Jiajie Lin(林家杰), Li Yue(岳丽), Tiangui You(游天桂), Chang Wang(王长), Xin Ou(欧欣), Shumin Wang(王庶民)
Shuyan Zhao(赵舒燕)1,2, Yuxin Song(宋禹忻)1, Hao Liang(梁好)1,2, Tingting Jin(金婷婷)1,2, Jiajie Lin(林家杰)1,2, Li Yue(岳丽)1,2, Tiangui You(游天桂)1,2, Chang Wang(王长)1,2, Xin Ou(欧欣)1,2, Shumin Wang(王庶民)1,2,3
摘要: Strain and stress were simulated using finite element method (FEM) for three Ⅲ-V-on-Insulator (Ⅲ-VOI) structures, i.e., InP/SiO2/Si, InP/Al2O3/SiO2/Si, and GaAs/Al2O3/SiO2/Si, fabricated by ion-slicing as the substrates for optoelectronic devices on Si. The thermal strain/stress imposes no risk for optoelectronic structures grown on InPOI at a normal growth temperature using molecular beam epitaxy. Structures grown on GaAsOI are more dangerous than those on InPOI due to a limited critical thickness. The intermedia Al2O3 layer was intended to increase the adherence while it brings in the largest risk. The simulated results reveal thermal stress on Al2O3 over 1 GPa, which is much higher than its critical stress for interfacial fracture. InPOI without an Al2O3 layer is more suitable as the substrate for optoelectronic integration on Si.
中图分类号: (Semiconductor-insulator-semiconductor structures)