Standardization of proton-induced x-ray emission technique for analysis of thick samples

doi:10.1088/1674-1056/24/9/090601

中国物理B ›› 2015, Vol. 24 ›› Issue (9): 90601-090601.doi: 10.1088/1674-1056/24/9/090601

Standardization of proton-induced x-ray emission technique for analysis of thick samples

Shad Ali^a, Johar Zeb^a, Abdul Ahad^b, Ishfaq Ahmad^b, M. Haneef^a, Jehan Akbar^a

a Department of Physics Hazara University, Mansehra, Pakistan;
b National Center of Physics (NCP), Islamabad, Pakistan

收稿日期:2015-03-16 修回日期:2015-05-04 出版日期:2015-09-05 发布日期:2015-09-05

Standardization of proton-induced x-ray emission technique for analysis of thick samples

Shad Ali^a, Johar Zeb^a, Abdul Ahad^b, Ishfaq Ahmad^b, M. Haneef^a, Jehan Akbar^a

a Department of Physics Hazara University, Mansehra, Pakistan;
b National Center of Physics (NCP), Islamabad, Pakistan

Received:2015-03-16 Revised:2015-05-04 Online:2015-09-05 Published:2015-09-05
Contact: Jehan Akbar E-mail:Jehan@hu.edu.pk

摘要/Abstract

摘要： This paper describes the standardization of the proton-induced x-ray emission (PIXE) technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard reference materials (SRMs) were analyzed using this technique and the data were compared with the already known data of these certified SRMs. These samples were selected in order to cover the maximum range of elements in the periodic table. Each sample was irradiated for three different values of collected beam charges at three different times. A proton beam of 2.57 MeV obtained using 5UDH-II Pelletron accelerator was used for excitation of x-rays from the sample. The acquired experimental data were analyzed using the GUPIXWIN software. The results show that the SRM data and the data obtained using the PIXE technique are in good agreement.

关键词: standardization, thick samples, PIXE analysis

Abstract: This paper describes the standardization of the proton-induced x-ray emission (PIXE) technique for finding the elemental composition of thick samples. For the standardization, three different samples of standard reference materials (SRMs) were analyzed using this technique and the data were compared with the already known data of these certified SRMs. These samples were selected in order to cover the maximum range of elements in the periodic table. Each sample was irradiated for three different values of collected beam charges at three different times. A proton beam of 2.57 MeV obtained using 5UDH-II Pelletron accelerator was used for excitation of x-rays from the sample. The acquired experimental data were analyzed using the GUPIXWIN software. The results show that the SRM data and the data obtained using the PIXE technique are in good agreement.

Key words: standardization, thick samples, PIXE analysis

中图分类号: (Standards and calibration)

06.20.fb

96.50.Pw (Particle acceleration) 78.70.Dm (X-ray absorption spectra) 92.20.Wx (Trace elements)

Shad Ali, Johar Zeb, Abdul Ahad, Ishfaq Ahmad, M. Haneef, Jehan Akbar. Standardization of proton-induced x-ray emission technique for analysis of thick samples[J]. 中国物理B, 2015, 24(9): 90601-090601.

Shad Ali, Johar Zeb, Abdul Ahad, Ishfaq Ahmad, M. Haneef, Jehan Akbar. Standardization of proton-induced x-ray emission technique for analysis of thick samples[J]. Chin. Phys. B, 2015, 24(9): 90601-090601.

参考文献 11

[1]	Johansson S A E and Johansson T B 1976 Nuclear Intrument and Methods 137 473
[2]	Johansson S A E, Campbell J L and Malmqvist K G 1995 Particle-Induced X-ray Emission Spectroscopy (New York: John Willey & Sons) pp. 147-412
[3]	Ene A, Popescu I V, Stihi C, Gheboianu A, Pantelica A and Petre C 2009 Rom. Jour. Phy 55 806
[4]	Cohen D D, Siegele R, Orlic I and Stelcer E 2001 Long Term Accuracy and Precision of PIXE and PIGI Measurments for Thin and Thick Sample Analysis, June 8-12, 2001, Menai, Australia, p. 1
[5]	Kasahara M, Ogiwara G, Yamamoto K, Park J H and Takahashi 1994 Int. Journal of PIXE 4 155
[6]	Nejedly Z and Campbell J L 2000 Nuclear Instruments and Methods in Physics Research B 160 415
[7]	Kabir M H 2007 Particle Induced X-ray Emission (PIXE) Setup and Quantitative Elemental Analysis (Ph. D. Dissertation) (Kochi: University of Technology Japan)
[8]	Govil M 2001 Current Science 80 1542
[9]	Johansson S A E and Compbell J L 1988 PIXE: A Noval Technique for Elemental Analysis (Chechister: John Wiley & Sons) p. 28
[10]	Czamamske G K, Sisson T W, Campbell J L and Teesdale W J 1993 American Mineralogist 78 893
[11]	Shariff A, Bulow K, Elfman M, Kristiansson P, Malmqvist K and Pallon J 2002 Nuclear Instruments and Methods in Physics Research B 189 131

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Standardization of proton-induced x-ray emission technique for analysis of thick samples

Standardization of proton-induced x-ray emission technique for analysis of thick samples

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