中国物理B ›› 2009, Vol. 18 ›› Issue (11): 5015-5019.doi: 10.1088/1674-1056/18/11/066
高欣, 杨生胜, 薛玉雄, 李凯, 李丹明, 王鹢, 王云飞, 冯展祖
Gao Xin(高欣)†, Yang Sheng-Sheng(杨生胜), Xue Yu-Xiong(薛玉雄), Li Kai(李凯), Li Dan-Ming(李丹明), Wang Yi(王鹢), Wang Yun-Fei(王云飞), and Feng Zhan-Zu(冯展祖)
摘要: The displacement damage dose methodology for analysing and modelling the performance of triple-junction InGaP2/GaAs/Ge solar cells in an electron radiation environment is presented. Degradations at different electron energies are correlated with displacement damage dose (D_\rm d). One particular electron radiation environment, relative to a geosynchronous earth orbit (GEO), is chosen to calculate the total D_\rm d behind the different thicknesses coverglasses to predict the performance degradation at the end of the 15-year mission.
中图分类号: (Photoelectric conversion)