中国物理B ›› 2024, Vol. 33 ›› Issue (6): 67104-067104.doi: 10.1088/1674-1056/ad4325
Jiajun Chen(陈佳骏)1, Xindeng Lv(吕心邓)1, Simin Li(李思敏)1, Yaqian Dan(但雅倩)1, Yanping Huang(黄艳萍)1,†, and Tian Cui(崔田)1,2,‡
Jiajun Chen(陈佳骏)1, Xindeng Lv(吕心邓)1, Simin Li(李思敏)1, Yaqian Dan(但雅倩)1, Yanping Huang(黄艳萍)1,†, and Tian Cui(崔田)1,2,‡
摘要: Conventional theories expect that materials under pressure exhibit expanded valence and conduction bands, leading to increased electrical conductivity. Here, we report the electrical properties of the doped 1$T$-TiS$_{2}$ under high pressure by electrical resistance investigations, synchrotron x-ray diffraction, Raman scattering and theoretical calculations. Up to 70GPa, an unusual metal-semiconductor-metal transition occurs. Our first-principles calculations suggest that the observed anti-Wilson transition from metal to semiconductor at 17GPa is due to the electron localization induced by the intercalated Ti atoms. This electron localization is attributed to the strengthened coupling between the doped Ti atoms and S atoms, and the Anderson localization arising from the disordered intercalation. At pressures exceeding 30.5GPa, the doped TiS$_{2}$ undergoes a re-metallization transition initiated by a crystal structure phase transition. We assign the most probable space group as $P$2$_{1}$2$_{1}$2$_{1}$. Our findings suggest that materials probably will eventually undergo the Wilson transition when subjected to sufficient pressure.
中图分类号: (Metal-insulator transitions and other electronic transitions)