中国物理B ›› 2011, Vol. 20 ›› Issue (10): 107301-107301.doi: 10.1088/1674-1056/20/10/107301
• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇 下一篇
路红亮, 张晨栋, 蔡金明, 高敏, 邹强, 郭海明, 高鸿钧
Lu Hong-Liang(路红亮), Zhang Chen-Dong(张晨栋), Cai Jin-Ming(蔡金明), Gao Min(高敏), Zou Qiang(邹强), Guo Hai-Ming(郭海明), and Gao Hong-Jun(高鸿钧)†
摘要: A method of measuring the thermoelectric power of nano-heterostructures based on four-probe scanning tunneling microscopy is presented. The process is composed of the it in-situ fabrication of a tungsten-indium tip, the precise control of the tip-sample contact and the identification of thermoelectric potential. When the temperature of the substrate is elevated, while that of the tip is kept at room temperature, a thermoelectric potential occurs and can be detected by a current-voltage measurement. As an example of its application, the method is demonstrated to be effective to measure the thermoelectric power in several systems. A Seebeck coefficient of tens of μV/K is obtained in graphene epitaxially grown on Ru (0001) substrate and the thermoelectric potential polarity of this system is found to be the reverse of that of bare Ru (0001) substrate.
中图分类号: (Thermoelectric effects)