中国物理B ›› 2008, Vol. 17 ›› Issue (1): 303-306.doi: 10.1088/1674-1056/17/1/053

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The origin of blue photoluminescence from nc-Si/SiO2 multilayers

马忠元, 郭四华, 陈德媛, 魏德远, 姚瑶, 周江, 黄锐, 李伟, 徐骏, 徐岭, 黄信凡, 陈坤基, 冯端   

  1. State Key Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China
  • 出版日期:2008-01-20 发布日期:2008-01-20
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos 60508009, 60471021, 60571008 and 10574069) and the Nature Science Foundation of Jiangsu Province, China (Grant No BK2007135).

The origin of blue photoluminescence from nc-Si/SiO2 multilayers

Ma Zhong-Yuan(马忠元), Guo Si-Hua(郭四华), Chen De-Yuan(陈德媛), Wei De-Yuan(魏德远)， Yao Yao(姚瑶)， Zhou Jiang(周江)， Huang Rui(黄锐), Li Wei(李伟), Xu Jun(徐骏), Xu Ling(徐岭), Huang Xin-Fan(黄信凡), Chen Kun-Ji(陈坤基), and Feng Duan(冯端)   

  1. State Key Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China
  • Online:2008-01-20 Published:2008-01-20
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos 60508009, 60471021, 60571008 and 10574069) and the Nature Science Foundation of Jiangsu Province, China (Grant No BK2007135).

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摘要： Intensive blue photoluminescence (PL) was observed at room temperature from the nanocrystalline-Si/SiO$_{2}$ (nc-Si/SiO$_{2})$ multilayers (MLs) obtained by thermal annealing of SiO/SiO$_{2}$ MLs for the first time. By controlling the size of nc-Si formed in SiO sublayer from 3.5 to 1.5 nm, the PL peak blueshifts from 457 to 411 nm. Combining the analysis of TEM, Raman and absorption measurement, this paper attributes the blue PL to multiple luminescent centres at the interface of nc-Si and SiO$_{2}$.

关键词: PL, nc-Si, Raman spectroscopy

Abstract: Intensive blue photoluminescence (PL) was observed at room temperature from the nanocrystalline-Si/SiO$_{2}$ (nc-Si/SiO$_{2})$ multilayers (MLs) obtained by thermal annealing of SiO/SiO$_{2}$ MLs for the first time. By controlling the size of nc-Si formed in SiO sublayer from 3.5 to 1.5 nm, the PL peak blueshifts from 457 to 411 nm. Combining the analysis of TEM, Raman and absorption measurement, this paper attributes the blue PL to multiple luminescent centres at the interface of nc-Si and SiO$_{2}$.

Key words: PL, nc-Si, Raman spectroscopy

中图分类号:  (Multilayers; superlattices; photonic structures; metamaterials)

  • 78.67.Pt
78.67.Bf (Nanocrystals, nanoparticles, and nanoclusters) 78.55.-m (Photoluminescence, properties and materials) 78.30.-j (Infrared and Raman spectra) 81.40.Ef (Cold working, work hardening; annealing, post-deformation annealing, quenching, tempering recovery, and crystallization) 68.37.Lp (Transmission electron microscopy (TEM))