中国物理B ›› 2001, Vol. 10 ›› Issue (5): 429-432.doi: 10.1088/1009-1963/10/5/313
王俊1, 柳义1, 董宝中1, 李志宏2, 巩雁军2, 张晔2, 吴东2, 孙予罕2
Li Zhi-hong (李志宏)a, Gong Yan-jun (巩雁军)a, Zhang Ye (张晔)a, Wu Dong (吴东)a, Sun Yu-han (孙予罕)a, Wang Jun (王俊)b, Liu Yi (柳义)b, Dong Bao-zhong (董宝中)b
摘要: Small angle X-ray scattering experiments have been performed to study the microstructure of mesoporous silica materials prepared by condensation of tetraethylorthosilicate using non-ionic alkylpolyethyleneoxide (AEO9) and ionic cetyltrimethylammonium bromide (CTAB) surfactant as templates. It is the pores within the nanometre range that produce the main scattering. The scattering of the pure silica systems obey Porod's law. The scattering of the systems with templates remaining in the pores show positive deviations from Porod's law. This may be because the templates produce some additional scattering background and then make the scattering of pores distorted. The results show that the full removal of templates from the pores of the materials by Soxhlet extraction is very easy for AEO9, but it is difficult for CTAB. The positive deviation correction is also performed.
中图分类号: (Powders, porous materials)