中国物理B ›› 2024, Vol. 33 ›› Issue (11): 116801-116801.doi: 10.1088/1674-1056/ad7aff

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Physics through the microscope

Stephen J. Pennycook1,2,†, Ryo Ishikawa3, Haijun Wu(武海军)4, Xiaoxu Zhao(赵晓续)5, Changjian Li(黎长建)6, Duane Loh7,8, Jiadong Dan7,8, and Wu Zhou(周武)1   

  1. 1 School of Physical Sciences and CAS Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing 100049, China;
    2 Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA;
    3 Institute of Engineering Innovation, University of Tokyo, Tokyo 113-8656, Japan;
    4 State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China;
    5 School of Materials Science and Engineering, Peking University, Beijing 100871, China;
    6 Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, China;
    7 Department of Physics, National University of Singapore, Singapore 117551, Singapore;
    8 Department of Biological Sciences, National University of Singapore, Singapore 117558, Singapore
  • 收稿日期:2024-07-27 修回日期:2024-09-09 接受日期:2024-09-14 出版日期:2024-11-15 发布日期:2024-11-15

Physics through the microscope

Stephen J. Pennycook1,2,†, Ryo Ishikawa3, Haijun Wu(武海军)4, Xiaoxu Zhao(赵晓续)5, Changjian Li(黎长建)6, Duane Loh7,8, Jiadong Dan7,8, and Wu Zhou(周武)1   

  1. 1 School of Physical Sciences and CAS Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing 100049, China;
    2 Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA;
    3 Institute of Engineering Innovation, University of Tokyo, Tokyo 113-8656, Japan;
    4 State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China;
    5 School of Materials Science and Engineering, Peking University, Beijing 100871, China;
    6 Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, China;
    7 Department of Physics, National University of Singapore, Singapore 117551, Singapore;
    8 Department of Biological Sciences, National University of Singapore, Singapore 117558, Singapore
  • Received:2024-07-27 Revised:2024-09-09 Accepted:2024-09-14 Online:2024-11-15 Published:2024-11-15
  • Contact: Stephen J. Pennycook E-mail:stevepennycook@gmail.com

摘要: The electron microscope provides numerous insights into physics, from demonstrations of fundamental quantum mechanical principles to the physics of imaging and materials. It reveals the atomic and electronic structure of key regions such as defects and interfaces. We can learn the underlying physics governing properties, and gain insight into how to synthesize new materials with improved properties. Some recent advances and possible future directions are discussed.

关键词: scanning transmission electron microscopy, materials science, point defects, artificial intelligence

Abstract: The electron microscope provides numerous insights into physics, from demonstrations of fundamental quantum mechanical principles to the physics of imaging and materials. It reveals the atomic and electronic structure of key regions such as defects and interfaces. We can learn the underlying physics governing properties, and gain insight into how to synthesize new materials with improved properties. Some recent advances and possible future directions are discussed.

Key words: scanning transmission electron microscopy, materials science, point defects, artificial intelligence

中图分类号:  (Scanning transmission electron microscopy (STEM))

  • 68.37.Ma
87.64.Ee (Electron microscopy) 81.07.-b (Nanoscale materials and structures: fabrication and characterization) 47.54.Jk (Materials science applications)