中国物理B ›› 2022, Vol. 31 ›› Issue (3): 34202-034202.doi: 10.1088/1674-1056/ac1e10
New multiplexed system for synchronous measurement of out-of-plane deformation and two orthogonal slopes
Yonghong Wang(王永红)1,2, Xiao Zhang(张肖)1, Qihan Zhao(赵琪涵)1, Yanfeng Yao(姚彦峰)1, Peizheng Yan(闫佩正)1,†, and Biao Wang(王标)1
- 1 School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China;
2 Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei 230009, China
New multiplexed system for synchronous measurement of out-of-plane deformation and two orthogonal slopes
Yonghong Wang(王永红)1,2, Xiao Zhang(张肖)1, Qihan Zhao(赵琪涵)1, Yanfeng Yao(姚彦峰)1, Peizheng Yan(闫佩正)1,†, and Biao Wang(王标)1
- 1 School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China;
2 Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei 230009, China
摘要： We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with the unpolarized object beam to measure the out-of-plane deformation. A modified Mach—Zehnder interferometer is used to measure the two orthogonal slopes of the out-of-plane deformation. One of the object beams of the Mach—Zehnder interferometer is an unpolarized beam, and the other object beam is split into two orthogonal linearly polarized object beams by a polarizing prism. The two beams are orthogonally polarized. Hence, they will not interfere with each other. The two polarized beams respectively interfere with the unpolarized beam to simultaneously measure the two orthogonal slopes of the out-of-plane deformation. In addition, the imaging lens and apertures are respectively placed in three optical paths to independently control the carrier frequencies and shearing amounts. The effectiveness of this method can be proved by measuring two pressure-loaded circular plates.
中图分类号: (Optical system design)
- 42.15.Eq