中国物理B ›› 2021, Vol. 30 ›› Issue (11): 116101-116101.doi: 10.1088/1674-1056/ac0132

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Analytical solution of crystal diffraction intensity

Wan-Li Shang(尚万里)1, Ao Sun(孙奥)1, Hua-Bin Du(杜华冰)1, Guo-Hong Yang(杨国洪)1, Min-Xi Wei(韦敏习)1,‡, Xu-Fei Xie(谢旭飞)1, Xing-Sen Che(车兴森)1, Li-Fei Hou(侯立飞)1, Wen-Hai Zhang(张文海)1, Miao Li(黎淼)2,†, Jun Shi(施军)3, Feng Wang(王峰)1, Hai-En He(何海恩)1, Jia-Min Yang(杨家敏)1, Shao-En Jiang(江少恩)1, and Bao-Han Zhang(张保汉)1   

  1. 1 Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China;
    2 College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China;
    3 Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400030, China;
    4 Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China
  • 收稿日期:2021-01-20 修回日期:2021-05-12 接受日期:2021-05-14 出版日期:2021-10-13 发布日期:2021-11-03
  • 通讯作者: Miao Li, Min-Xi Wei E-mail:limiao@cqupt.edu.cn;wmx17@sina.com
  • 基金资助:
    Project supported by the National Natural Science Fundation of China (Grant Nos. 11775203 and 12075219) and the China Academy of Engineering Physics (CAEP) Foundation (Grant No. CX20210019).

Analytical solution of crystal diffraction intensity

Wan-Li Shang(尚万里)1, Ao Sun(孙奥)1, Hua-Bin Du(杜华冰)1, Guo-Hong Yang(杨国洪)1, Min-Xi Wei(韦敏习)1,‡, Xu-Fei Xie(谢旭飞)1, Xing-Sen Che(车兴森)1, Li-Fei Hou(侯立飞)1, Wen-Hai Zhang(张文海)1, Miao Li(黎淼)2,†, Jun Shi(施军)3, Feng Wang(王峰)1, Hai-En He(何海恩)1, Jia-Min Yang(杨家敏)1, Shao-En Jiang(江少恩)1, and Bao-Han Zhang(张保汉)1   

  1. 1 Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China;
    2 College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China;
    3 Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400030, China;
    4 Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China
  • Received:2021-01-20 Revised:2021-05-12 Accepted:2021-05-14 Online:2021-10-13 Published:2021-11-03
  • Contact: Miao Li, Min-Xi Wei E-mail:limiao@cqupt.edu.cn;wmx17@sina.com
  • Supported by:
    Project supported by the National Natural Science Fundation of China (Grant Nos. 11775203 and 12075219) and the China Academy of Engineering Physics (CAEP) Foundation (Grant No. CX20210019).

摘要: Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal, and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness. In this study, a straightforward solution for the focusing schemes of flat and bent crystals is provided. Simulations with XOP code are performed to validate the analytical model, and good agreements are achieved. The von Hamos or multi-cone crystal can lead to several hundred times intensity enhancements for a 200μm plasma source. This model benefits the applications of the focusing bent crystals.

关键词: crystal diffraction, analytic method, x-ray diffraction

Abstract: Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal, and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness. In this study, a straightforward solution for the focusing schemes of flat and bent crystals is provided. Simulations with XOP code are performed to validate the analytical model, and good agreements are achieved. The von Hamos or multi-cone crystal can lead to several hundred times intensity enhancements for a 200μm plasma source. This model benefits the applications of the focusing bent crystals.

Key words: crystal diffraction, analytic method, x-ray diffraction

中图分类号:  (X-ray diffraction)

  • 61.05.cp
63.20.-e (Phonons in crystal lattices) 87.10.Ca (Analytical theories)