中国物理B ›› 2021, Vol. 30 ›› Issue (11): 116101-116101.doi: 10.1088/1674-1056/ac0132
Wan-Li Shang(尚万里)1, Ao Sun(孙奥)1, Hua-Bin Du(杜华冰)1, Guo-Hong Yang(杨国洪)1, Min-Xi Wei(韦敏习)1,‡, Xu-Fei Xie(谢旭飞)1, Xing-Sen Che(车兴森)1, Li-Fei Hou(侯立飞)1, Wen-Hai Zhang(张文海)1, Miao Li(黎淼)2,†, Jun Shi(施军)3, Feng Wang(王峰)1, Hai-En He(何海恩)1, Jia-Min Yang(杨家敏)1, Shao-En Jiang(江少恩)1, and Bao-Han Zhang(张保汉)1
Wan-Li Shang(尚万里)1, Ao Sun(孙奥)1, Hua-Bin Du(杜华冰)1, Guo-Hong Yang(杨国洪)1, Min-Xi Wei(韦敏习)1,‡, Xu-Fei Xie(谢旭飞)1, Xing-Sen Che(车兴森)1, Li-Fei Hou(侯立飞)1, Wen-Hai Zhang(张文海)1, Miao Li(黎淼)2,†, Jun Shi(施军)3, Feng Wang(王峰)1, Hai-En He(何海恩)1, Jia-Min Yang(杨家敏)1, Shao-En Jiang(江少恩)1, and Bao-Han Zhang(张保汉)1
摘要: Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal, and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness. In this study, a straightforward solution for the focusing schemes of flat and bent crystals is provided. Simulations with XOP code are performed to validate the analytical model, and good agreements are achieved. The von Hamos or multi-cone crystal can lead to several hundred times intensity enhancements for a 200μm plasma source. This model benefits the applications of the focusing bent crystals.
中图分类号: (X-ray diffraction)