中国物理B ›› 2018, Vol. 27 ›› Issue (6): 68801-068801.doi: 10.1088/1674-1056/27/6/068801

• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇    

Detection of finger interruptions in silicon solar cells using photoluminescence imaging

Lei Zhang(张磊), Peng Liang(梁鹏), Hui-Shi Zhu(朱慧时), Pei-De Han(韩培德)   

  1. State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 101407, China
  • 收稿日期:2017-12-26 修回日期:2018-04-09 出版日期:2018-06-05 发布日期:2018-06-05
  • 通讯作者: Lei Zhang, Pei-De Han E-mail:zhanglei615@semi.ac.cn;pdhan@red.semi.ac.cn
  • 基金资助:

    Project supported by the National Natural Science Foundation of China (Grant Nos.61504139 and 61275040) and the Fund from the Chinese Academy of Sciences (Grant No.Y072051002).

Detection of finger interruptions in silicon solar cells using photoluminescence imaging

Lei Zhang(张磊), Peng Liang(梁鹏), Hui-Shi Zhu(朱慧时), Pei-De Han(韩培德)   

  1. State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 101407, China
  • Received:2017-12-26 Revised:2018-04-09 Online:2018-06-05 Published:2018-06-05
  • Contact: Lei Zhang, Pei-De Han E-mail:zhanglei615@semi.ac.cn;pdhan@red.semi.ac.cn
  • Supported by:

    Project supported by the National Natural Science Foundation of China (Grant Nos.61504139 and 61275040) and the Fund from the Chinese Academy of Sciences (Grant No.Y072051002).

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摘要：

Finger interruptions are common problems in screen printed solar cells, resulting in poor performance in efficiency because of high effective series resistance. Electroluminescence (EL) imaging is typically used to identify interrupted fingers. In this paper, we demonstrate an alternative method based on photoluminescence (PL) imaging to identify local series resistance defects, with a particular focus on finger interruptions. Ability to detect finger interruptions by using PL imaging under current extraction is analyzed and verified. The influences of external bias control and illumination intensity on PL images are then studied in detail. Finally, in comparison with EL imaging, the using of PL imaging to identify finger interruptions possesses the prominent advantages:in PL images, regions affected by interrupted fingers show higher luminescence intensity, while regions affected by recombination defects show lower luminescence intensity. This inverse signal contrast allows PL imaging to more accurately identify the defect types.

关键词: silicon solar cells, luminescence, defects, series resistance

Abstract:

Since publication, it has been brought to the attention of the Editorial Office of Chinese Physics B that parts of this paper showed strong similarities to the following article (including one equation, some analyses, the motivation and the conclusion) without citation: “Detection of Finger Interruptions in Silicon Solar Cells Using Line Scan Photoluminescence Imaging,” IEEE Journal of Photovoltaics, 2017, vol. 7, No. 6, pp. 1496-1502. Following our investigation, this article has been retracted by the Editorial Office of Chinese Physics B.


Finger interruptions are common problems in screen printed solar cells, resulting in poor performance in efficiency because of high effective series resistance. Electroluminescence (EL) imaging is typically used to identify interrupted fingers. In this paper, we demonstrate an alternative method based on photoluminescence (PL) imaging to identify local series resistance defects, with a particular focus on finger interruptions. Ability to detect finger interruptions by using PL imaging under current extraction is analyzed and verified. The influences of external bias control and illumination intensity on PL images are then studied in detail. Finally, in comparison with EL imaging, the using of PL imaging to identify finger interruptions possesses the prominent advantages:in PL images, regions affected by interrupted fingers show higher luminescence intensity, while regions affected by recombination defects show lower luminescence intensity. This inverse signal contrast allows PL imaging to more accurately identify the defect types.

Key words: silicon solar cells, luminescence, defects, series resistance

中图分类号:  (Silicon solar cells)

  • 88.40.jj
78.55.-m (Photoluminescence, properties and materials)