Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries

doi:10.1088/1674-1056/27/6/066107

中国物理B ›› 2018, Vol. 27 ›› Issue (6): 66107-066107.doi: 10.1088/1674-1056/27/6/066107

所属专题： TOPICAL REVIEW — Electron microscopy methods for emergent materials and life sciences

• TOPICAL REVIEW—Electron microscopy methods for the emergent materials and life sciences • 上一篇下一篇

Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries

Yu-Xin Tong(仝毓昕), Qing-Hua Zhang(张庆华), Lin Gu(谷林)

1 Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
2 School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100190, China

收稿日期:2017-11-15 修回日期:2017-12-21 出版日期:2018-06-05 发布日期:2018-06-05
通讯作者: Qing-Hua Zhang, Lin Gu E-mail:zqh@iphy.ac.cn;l.gu@aphy.iphy.ac.cn
基金资助:
Project supported by the National Basic Research Program of China (Grant No.2014CB921002),the Strategic Priority Research Program of Chinese Academy of Sciences (Grant No.XDB07030200),and the National Natural Science Foundation of China (Grant Nos.51522212,51421002,and 51672307).

Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries

Yu-Xin Tong(仝毓昕)^1,2, Qing-Hua Zhang(张庆华)¹, Lin Gu(谷林)^1,2

1 Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
2 School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100190, China

Received:2017-11-15 Revised:2017-12-21 Online:2018-06-05 Published:2018-06-05
Contact: Qing-Hua Zhang, Lin Gu E-mail:zqh@iphy.ac.cn;l.gu@aphy.iphy.ac.cn
Supported by:
Project supported by the National Basic Research Program of China (Grant No.2014CB921002),the Strategic Priority Research Program of Chinese Academy of Sciences (Grant No.XDB07030200),and the National Natural Science Foundation of China (Grant Nos.51522212,51421002,and 51672307).

摘要/Abstract

摘要：

Scanning transmission electron microscopy (STEM) has been shown as powerful tools for material characterization, especially after the appearance of aberration-corrector which greatly enhances the resolution of STEM. High angle annular dark field (HAADF) and annular bright field (ABF) imaging of the aberration-corrected STEM are widely used due to their high-resolution capabilities and easily interpretable image contrasts. However, HAADF mode of the STEM is still limited in detecting light elements due to the weak electron-scattering power. ABF mode of the STEM could detect light and heavy elements simultaneously, providing unprecedented opportunities for probing unknown structures of materials. Atomic-level structure investigation of materials has been achieved by means of these imaging modes, which is invaluable in many fields for either improving properties of materials or developing new materials. This paper aims to provide a introduction of HAADF and ABF imaging techniques and reviews their applications in characterization of cathode materials, study of electrochemical reaction mechanisms, and exploring the effective design of lithium-ion batteries (LIBs). The future prospects of the STEM are also discussed.

关键词: scanning transmission electron microscopy, high angle annular dark field, annular bright field, lithium-ion batteries

Abstract:

Key words: scanning transmission electron microscopy, high angle annular dark field, annular bright field, lithium-ion batteries

中图分类号: (Crystallographic aspects of phase transformations; pressure effects)

61.50.Ks

68.37.Ma (Scanning transmission electron microscopy (STEM)) 82.45.Fk (Electrodes) 82.47.Aa (Lithium-ion batteries)

仝毓昕, 张庆华, 谷林. Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries[J]. 中国物理B, 2018, 27(6): 66107-066107.

Yu-Xin Tong(仝毓昕), Qing-Hua Zhang(张庆华), Lin Gu(谷林). Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries[J]. Chin. Phys. B, 2018, 27(6): 66107-066107.

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Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries

Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries

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