中国物理B ›› 2018, Vol. 27 ›› Issue (11): 117103-117103.doi: 10.1088/1674-1056/27/11/117103

• INVITED REVIEW • 上一篇    下一篇

Electronic structures of impurities and point defects in semiconductors

Yong Zhang(张勇)   

  1. Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, NC 28223, USA
  • 收稿日期:2018-07-12 修回日期:2018-09-04 出版日期:2018-11-05 发布日期:2018-11-05
  • 通讯作者: Yong Zhang E-mail:yong.zhang@uncc.edu

Electronic structures of impurities and point defects in semiconductors

Yong Zhang(张勇)   

  1. Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, NC 28223, USA
  • Received:2018-07-12 Revised:2018-09-04 Online:2018-11-05 Published:2018-11-05
  • Contact: Yong Zhang E-mail:yong.zhang@uncc.edu

摘要:

A brief history of the impurity theories in semiconductors is provided. A bound exciton model is proposed for both donor-and acceptor-like impurities and point defects, which offers a unified understanding for “shallow” and “deep” impurities and point defects. The underlying physics of computational results using different density-functional theory-based approaches are discussed and interpreted in the framework of the bound exciton model.

关键词: semiconductor, shallow impurity, deep impurity, bound exciton, density-functional theory, effective-mass theory, hydrogen model

Abstract:

A brief history of the impurity theories in semiconductors is provided. A bound exciton model is proposed for both donor-and acceptor-like impurities and point defects, which offers a unified understanding for “shallow” and “deep” impurities and point defects. The underlying physics of computational results using different density-functional theory-based approaches are discussed and interpreted in the framework of the bound exciton model.

Key words: semiconductor, shallow impurity, deep impurity, bound exciton, density-functional theory, effective-mass theory, hydrogen model

中图分类号:  (Impurity and defect levels)

  • 71.55.-i
72.20.-i (Conductivity phenomena in semiconductors and insulators) 78.20.-e (Optical properties of bulk materials and thin films)