中国物理B ›› 2017, Vol. 26 ›› Issue (10): 107501-107501.doi: 10.1088/1674-1056/26/10/107501

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

Effects of spacer layers on magnetic properties and exchange couplings of Nd-Fe-B/Nd-Ce-Fe-B multilayer films

Ya-Chao Sun(孙亚超), Ming-Gang Zhu(朱明刚), Wei Liu(刘伟), Rui Han(韩瑞), Wen-Chen Zhang(张文臣), Yan-Feng Li(李岩峰), Wei Li(李卫)   

  1. 1. Division of Functional Materials, Central Iron & Steel Research Institute, Beijing 100081, China;
    2. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
  • 收稿日期:2017-05-15 修回日期:2017-07-07 出版日期:2017-10-05 发布日期:2017-10-05
  • 通讯作者: Ming-Gang Zhu E-mail:mgzhu@sina.com
  • 基金资助:

    Project supported by the Major State Basic Research Development Program of China (Grant No. 2014CB643701) and the General Program of the National Natural Science Foundation of China (Grant No. 51571064).

Effects of spacer layers on magnetic properties and exchange couplings of Nd-Fe-B/Nd-Ce-Fe-B multilayer films

Ya-Chao Sun(孙亚超)1, Ming-Gang Zhu(朱明刚)1, Wei Liu(刘伟)2, Rui Han(韩瑞)1, Wen-Chen Zhang(张文臣)1, Yan-Feng Li(李岩峰)1, Wei Li(李卫)1   

  1. 1. Division of Functional Materials, Central Iron & Steel Research Institute, Beijing 100081, China;
    2. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
  • Received:2017-05-15 Revised:2017-07-07 Online:2017-10-05 Published:2017-10-05
  • Contact: Ming-Gang Zhu E-mail:mgzhu@sina.com
  • Supported by:

    Project supported by the Major State Basic Research Development Program of China (Grant No. 2014CB643701) and the General Program of the National Natural Science Foundation of China (Grant No. 51571064).

摘要:

The influences of the spacer-layer Ta on the structures and magnetic properties of NdFeB/NdCeFeB multilayer films are investigated via DC sputtering under an Ar pressure of 1.2 Pa. An obvious (00l) texture of the hard phase is observed in each of the films, which indicates that the main phase of the film does not significantly change with Ta spacer-layer thickness. As a result, both the remanence and the saturation magnetization of the magnet first increase and then decrease, and the maximum values of 4π Mr and Hcj are 10.4 kGs (1 Gs=10-4 T) and 15.0 kOe (1 Oe=79.5775 A·m-1) for the film with a 2-nm-thick Ta spacer-layer, respectively, where the crystalline structures are columnar shape particles. The measured relationship between irreversible portion D (H)=-△ Mirr/2Mr and H indicates that the nucleation field of the film decreases with spacer layer thickness increasing, owing to slightly disordered grains near the interface between different magnetic layers.

关键词: permanent magnets, multilayer films, spacer layer, irreversible

Abstract:

The influences of the spacer-layer Ta on the structures and magnetic properties of NdFeB/NdCeFeB multilayer films are investigated via DC sputtering under an Ar pressure of 1.2 Pa. An obvious (00l) texture of the hard phase is observed in each of the films, which indicates that the main phase of the film does not significantly change with Ta spacer-layer thickness. As a result, both the remanence and the saturation magnetization of the magnet first increase and then decrease, and the maximum values of 4π Mr and Hcj are 10.4 kGs (1 Gs=10-4 T) and 15.0 kOe (1 Oe=79.5775 A·m-1) for the film with a 2-nm-thick Ta spacer-layer, respectively, where the crystalline structures are columnar shape particles. The measured relationship between irreversible portion D (H)=-△ Mirr/2Mr and H indicates that the nucleation field of the film decreases with spacer layer thickness increasing, owing to slightly disordered grains near the interface between different magnetic layers.

Key words: permanent magnets, multilayer films, spacer layer, irreversible

中图分类号:  (Magnetic properties of thin films, surfaces, and interfaces)

  • 75.70.-i
75.60.Nt (Magnetic annealing and temperature-hysteresis effects) 68.55.-a (Thin film structure and morphology)