STED microscopy based on axially symmetric polarized vortex beams

doi:10.1088/1674-1056/25/3/030701

中国物理B ›› 2016, Vol. 25 ›› Issue (3): 30701-030701.doi: 10.1088/1674-1056/25/3/030701

STED microscopy based on axially symmetric polarized vortex beams

Zhehai Zhou(周哲海), Lianqing Zhu(祝连庆)

Beijing Key Laboratory for Optoelectronic Measurement Technology, Beijing Information Science and Technology University, Beijing 100192, China

收稿日期:2015-11-03 修回日期:2015-12-14 出版日期:2016-03-05 发布日期:2016-03-05
通讯作者: Zhehai Zhou, Lianqing Zhu E-mail:zhouzhehai@bistu.edu.cn;zhulianqing@sina.com
基金资助:
Project supported by the National Natural Science Foundation of China (Grant Nos. 61108047 and 61475021), the Natural Science Foundation of Beijing, China (Grant No. 4152015), the Program for New Century Excellent Talents in Universities of China (Grant No. NCET-13-0667), and the Top Young Talents Support Program of Beijing, China (Grant No. CIT&TCD201404113).

STED microscopy based on axially symmetric polarized vortex beams

Zhehai Zhou(周哲海), Lianqing Zhu(祝连庆)

Beijing Key Laboratory for Optoelectronic Measurement Technology, Beijing Information Science and Technology University, Beijing 100192, China

Received:2015-11-03 Revised:2015-12-14 Online:2016-03-05 Published:2016-03-05
Contact: Zhehai Zhou, Lianqing Zhu E-mail:zhouzhehai@bistu.edu.cn;zhulianqing@sina.com
Supported by:
Project supported by the National Natural Science Foundation of China (Grant Nos. 61108047 and 61475021), the Natural Science Foundation of Beijing, China (Grant No. 4152015), the Program for New Century Excellent Talents in Universities of China (Grant No. NCET-13-0667), and the Top Young Talents Support Program of Beijing, China (Grant No. CIT&TCD201404113).

摘要/Abstract

摘要： A stimulated emission depletion (STED) microscopy scheme using axially symmetric polarized vortex beams is proposed based on unique focusing properties of such kinds of beams. The concept of axially symmetric polarized vortex beams is first introduced, and the basic principle about the scheme is described. Simulation results for several typical beams are then shown, including radially polarized vortex beams, azimuthally polarized vortex beams, and high-order axially symmetric polarized vortex beams. The results indicate that sharper doughnut spots and thus higher resolutions can be achieved, showing more flexibility than previous schemes based on flexible modulation of both phase and polarization for incident beams.

关键词: stimulated emission depletion (STED), super-resolution microscopy, axially symmetric polarized vortex beams

Abstract: A stimulated emission depletion (STED) microscopy scheme using axially symmetric polarized vortex beams is proposed based on unique focusing properties of such kinds of beams. The concept of axially symmetric polarized vortex beams is first introduced, and the basic principle about the scheme is described. Simulation results for several typical beams are then shown, including radially polarized vortex beams, azimuthally polarized vortex beams, and high-order axially symmetric polarized vortex beams. The results indicate that sharper doughnut spots and thus higher resolutions can be achieved, showing more flexibility than previous schemes based on flexible modulation of both phase and polarization for incident beams.

Key words: stimulated emission depletion (STED), super-resolution microscopy, axially symmetric polarized vortex beams

中图分类号: (Optical instruments and equipment)

07.60.-j

42.15.Eq (Optical system design) 42.25.Ja (Polarization) 42.30.-d (Imaging and optical processing)

周哲海, 祝连庆. STED microscopy based on axially symmetric polarized vortex beams[J]. 中国物理B, 2016, 25(3): 30701-030701.

Zhehai Zhou(周哲海), Lianqing Zhu(祝连庆). STED microscopy based on axially symmetric polarized vortex beams[J]. Chin. Phys. B, 2016, 25(3): 30701-030701.

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STED microscopy based on axially symmetric polarized vortex beams

STED microscopy based on axially symmetric polarized vortex beams

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