中国物理B ›› 2012, Vol. 21 ›› Issue (3): 37802-037802.doi: 10.1088/1674-1056/21/3/037802

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詹锋1 2,贺继方2,尚向军2,李密锋2,倪海桥2,徐应强2,牛智川2   

  • 收稿日期:2011-03-30 修回日期:2011-10-09 出版日期:2012-02-15 发布日期:2012-02-15
  • 通讯作者: 牛智川,zcniu@semi.ac.cn E-mail:zcniu@semi.ac.cn

An effective reflectance method for designing broadband antireflection films coupled with solar cells

Zhan Feng(詹锋)a) b), He Ji-Fang(贺继方) b), Shang Xiang-Jun(尚向军)b), Li Mi-Feng(李密锋)b), Ni Hai-Qiao(倪海桥)b), Xu Ying-Qiang(徐应强) b), and Niu Zhi-Chuan(牛智川)b)†   

  1. a. The Key Laboratory of Nonferrous Metal Materials and New Processing Technology of Ministry of Education, Guangxi University, Nanning 530004, China;
    b. State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • Received:2011-03-30 Revised:2011-10-09 Online:2012-02-15 Published:2012-02-15
  • Contact: Niu Zhi-Chuan,zcniu@semi.ac.cn E-mail:zcniu@semi.ac.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 61176012 and 90921015), the National Basic Research Program of China (Grant Nos. 2010CB327601 and 2012CB932701), and the National Science Foundation for Post-doctoral Scientists of China (Grant No. 20080440507).

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Abstract: The solar spectrum covers a broad wavelength range, which requires that antireflection coating (ARC) is effective over a relatively wide wavelength range for more incident light coming into the cell. In this paper, we present two methods to measure the composite reflection of SiO2/ZnS double-layer ARC in the wavelength ranges of 300-870 nm (dual-junction) and 300-1850 nm (triple-junction), under the solar spectrum AM0. In order to give sufficient consideration to the ARC coupled with the window layer and the dispersion effect of the refractive index of each layer, we use multi-dimensional matrix data for reliable simulation. A comparison between the results obtained from the weighted-average reflectance (WAR) method commonly used and that from the effective-average reflectance (EAR) method introduced here shows that the optimized ARC through minimizing the effective-average reflectance is convenient and available.

Key words: weighted-average reflectance, effective-average reflectance, transfer matrix

中图分类号:  (Optical properties of bulk materials and thin films)

  • 78.20.-e
78.20.Bh (Theory, models, and numerical simulation) 78.20.Ci (Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)) 78.30.Fs (III-V and II-VI semiconductors)