中国物理B ›› 2011, Vol. 20 ›› Issue (3): 37901-037901.doi: 10.1088/1674-1056/20/3/037901

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The charging stability of different silica glasses studied by measuring the secondary electron emission yield

Bertrand Poumellec1, 赵谡玲2   

  1. (1)ICMMO/LPCES, UMR CNRS-UPS 8182, Université de Paris Sud, 91405 Orsay Cedex, France; (2)Key Laboratory of Luminescence and Optical Information, Beijing Jiaotong University, Ministry of Education, Beijing 100044, China
  • 收稿日期:2009-12-08 修回日期:2010-10-15 出版日期:2011-03-15 发布日期:2011-03-15

The charging stability of different silica glasses studied by measuring the secondary electron emission yield

Zhao Su-Ling(赵谡玲)a)† and Bertrand Poumellecb)‡   

  1. a Key Laboratory of Luminescence and Optical Information, Beijing Jiaotong University, Ministry of Education, Beijing 100044, China; b ICMMO/LPCES, UMR CNRS-UPS 8182, Université de Paris Sud, 91405 Orsay Cedex, France
  • Received:2009-12-08 Revised:2010-10-15 Online:2011-03-15 Published:2011-03-15

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摘要： This paper reports that the charging properties of lead silica, Suprasil silica and Infrasil silica are investigated by measuring the secondary electron emission (SEE) yield. At a primary electron beam energy of 25 keV, the intrinsic SEE yields measured at very low injection dose are 0.54, 0.29 and 0.35, respectively for lead silica, Suprasil and Infrasil silica glass. During the first e-beam irradiation at a high injection current density, the SEE yields of lead silica and Suprasil increase continuously and slowly from their initial values to a steady state. At the steady state, the SEE yields of lead silica and Suprasil are 0.94 and 0.93, respectively. In Infrasil, several charging and discharging processes are observed during the experiment. This shows that Infrasil does not reach its steady state. Two hours later, all samples are irradiated again in the same place as the first irradiation at a low current density and low dose. The SEE yields of lead silica, Suprasil and Infrasil are 0.69, 0.76 and 0.55, respectively. Twenty hours later, the values are 0.62, 0.64 and 0.33, respectively, for lead silica, Suprasil and Infrasil. These results show that Infrasil has poor charging stability. Comparatively, the charging stability of lead silica is better, and Suprasil has the best characteristics.

关键词: secondary electron emission yield, charging stability, nonlinear silica glass

Abstract: This paper reports that the charging properties of lead silica, Suprasil silica and Infrasil silica are investigated by measuring the secondary electron emission (SEE) yield. At a primary electron beam energy of 25 keV, the intrinsic SEE yields measured at very low injection dose are 0.54, 0.29 and 0.35, respectively for lead silica, Suprasil and Infrasil silica glass. During the first e-beam irradiation at a high injection current density, the SEE yields of lead silica and Suprasil increase continuously and slowly from their initial values to a steady state. At the steady state, the SEE yields of lead silica and Suprasil are 0.94 and 0.93, respectively. In Infrasil, several charging and discharging processes are observed during the experiment. This shows that Infrasil does not reach its steady state. Two hours later, all samples are irradiated again in the same place as the first irradiation at a low current density and low dose. The SEE yields of lead silica, Suprasil and Infrasil are 0.69, 0.76 and 0.55, respectively. Twenty hours later, the values are 0.62, 0.64 and 0.33, respectively, for lead silica, Suprasil and Infrasil. These results show that Infrasil has poor charging stability. Comparatively, the charging stability of lead silica is better, and Suprasil has the best characteristics.

Key words: secondary electron emission yield, charging stability, nonlinear silica glass

中图分类号: 

  • 79.20.Fr
77.22.Jp (Dielectric breakdown and space-charge effects) 42.65.Ky (Frequency conversion; harmonic generation, including higher-order harmonic generation)