Analysis of second-harmonic generation microscopy under refractive index mismatch

doi:10.1088/1009-1963/16/11/023

摘要/Abstract

关键词: microscopy, second-harmonic generation, polarization, refractive index mismatch

Abstract: On the basis of the vector diffraction theory and Green’s function method, this paper investigates the effects of refractive index mismatch on second-harmonic generation (SHG) microscopy. The polarization distribution and SHG intensity are calculated as functions of the sample radius and probe depth. The numerical results show that refractive index mismatch can result in peak intensity degradation, increase secondary lobes and extension of secondharmonic polarization distribution. Because of the attenuation of polarization intensity, the detected SHG intensity significantly decreases with increasing probe depth, which can limit the imaging depth of SHG microscopy inside thick samples. Forward SHG intensity decays slowly than backward SHG, due to the combination of extension secondharmonic polarization distribution and strong dependency of forward SHG on sample radius.

Key words: microscopy, second-harmonic generation, polarization, refractive index mismatch

中图分类号: (Frequency conversion; harmonic generation, including higher-order harmonic generation)

42.65.Ky

07.60.Pb (Conventional optical microscopes) 42.15.Fr (Aberrations)

王湘晖, 林列, 张杨. Analysis of second-harmonic generation microscopy under refractive index mismatch[J]. 中国物理B, 2007, 16(11): 3285-3289.

Wang Xiang-Hui(王湘晖), Lin Lie(林列), and Zhang Yang(张杨). Analysis of second-harmonic generation microscopy under refractive index mismatch[J]. Chinese Physics, 2007, 16(11): 3285-3289.

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