中国物理B ›› 2006, Vol. 15 ›› Issue (8): 1731-1737.doi: 10.1088/1009-1963/15/8/017

• GENERAL • 上一篇    下一篇

In-line phase contrast for weakly absorbing materials with a microfocus x-ray source

章 迪, 李 政, 黄志峰, 禹爱民, 沙 薇   

  1. Department of Engineering Physics, Tsinghua University, Beijing 100084, China
  • 收稿日期:2005-12-09 修回日期:2006-04-22 出版日期:2006-08-20 发布日期:2006-08-20
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No 10475044).

In-line phase contrast for weakly absorbing materials with a microfocus x-ray source

Zhang Di(章迪), Li Zheng(李政), Huang Zhi-Feng(黄志峰), Yu Ai-Min(禹爱民), and Sha Wei(沙薇)   

  1. Department of Engineering Physics, Tsinghua University, Beijing 100084, China
  • Received:2005-12-09 Revised:2006-04-22 Online:2006-08-20 Published:2006-08-20
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No 10475044).

摘要: For weakly absorbing materials, image contrast can be enhanced by phase contrast in formation. The effectiveness of the in-line phase contrast technique relies on its ability to record intensity data which contain information on the x-ray's phase shift. Four kinds of approaches to the relationship between intensity distribution and phase shift are reviewed and discussed. A micro-focal x-ray source with high geometrical magnification is used to acquire phase contrast images. A great improvement on image quality is shown and geometrical parameters are modified for comparison between different imaging positions.

Abstract: For weakly absorbing materials, image contrast can be enhanced by phase contrast in formation. The effectiveness of the in-line phase contrast technique relies on its ability to record intensity data which contain information on the x-ray's phase shift. Four kinds of approaches to the relationship between intensity distribution and phase shift are reviewed and discussed. A micro-focal x-ray source with high geometrical magnification is used to acquire phase contrast images. A great improvement on image quality is shown and geometrical parameters are modified for comparison between different imaging positions.

Key words: in-line phase contrast, intensity distribution, microfocus, Fresnel diffraction

中图分类号:  (X- and γ-ray sources, mirrors, gratings, and detectors)

  • 07.85.Fv
42.30.Kq (Fourier optics) 42.30.Wb (Image reconstruction; tomography)