中国物理B ›› 2005, Vol. 14 ›› Issue (8): 1536-1543.doi: 10.1088/1009-1963/14/8/011

• GENERAL • 上一篇    下一篇

Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems

林晓, 贺晓波, 路军岭, 高利, 郇庆, 时东霞, 高鸿钧   

  1. Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
  • 收稿日期:2004-10-10 修回日期:2005-03-03 出版日期:2005-07-13 发布日期:2005-07-13
  • 基金资助:
    Project supported by the Chinese Academy of Sciences, the National High Technology Research and Development Program of China, the State Key Development Program for Basic Research of China, and the National Natural Science Foundation of China (Grant Nos 90

Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems

Lin Xiao (林晓), He Xiao-Bo (贺晓波), Lu Jun-Ling (路军岭), Gao Li (高利), Huan Qing (郇庆), Shi Dong-Xia (时东霞), Gao Hong-Jun (高鸿钧)   

  1. Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
  • Received:2004-10-10 Revised:2005-03-03 Online:2005-07-13 Published:2005-07-13
  • Supported by:
    Project supported by the Chinese Academy of Sciences, the National High Technology Research and Development Program of China, the State Key Development Program for Basic Research of China, and the National Natural Science Foundation of China (Grant Nos 90

PDF (PC)

482

赞

摘要： We demonstrate a special four-probe scanning tunnelling microscope (STM) system in ultrahigh vacuum (UHV), which can provide coarse positioning for every probe independently with the help of scanning electron microscope (SEM) and fine positioning down to nanometre using the STM technology. The system allows conductivity measurement by means of a four-point probe method, which can draw out more accurate electron transport characteristics in nanostructures, and provides easy manipulation of low dimension materials. All measurements can be performed in variable temperature (from 30K to 500K), magnetic field (from 0 to 0.1T), and different gas environments. Simultaneously, the cathodoluminescence (CL) spectrum can be achieved through an optical subsystem. Test measurements using some nanowire samples show that this system is a powerful tool in exploring electron transport characteristics and spectra in nanoscale physics.

Abstract: We demonstrate a special four-probe scanning tunnelling microscope (STM) system in ultrahigh vacuum (UHV), which can provide coarse positioning for every probe independently with the help of scanning electron microscope (SEM) and fine positioning down to nanometre using the STM technology. The system allows conductivity measurement by means of a four-point probe method, which can draw out more accurate electron transport characteristics in nanostructures, and provides easy manipulation of low dimension materials. All measurements can be performed in variable temperature (from 30K to 500K), magnetic field (from 0 to 0.1T), and different gas environments. Simultaneously, the cathodoluminescence (CL) spectrum can be achieved through an optical subsystem. Test measurements using some nanowire samples show that this system is a powerful tool in exploring electron transport characteristics and spectra in nanoscale physics.

Key words: four-probe STM, nanodevice, electrical measurement, manipulation, CL

中图分类号:  (Electro-optical effects)

  • 78.20.Jq
78.60.Hk (Cathodoluminescence, ionoluminescence) 78.67.-n (Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures) 73.63.-b (Electronic transport in nanoscale materials and structures) 81.16.Ta (Atom manipulation)