中国物理B ›› 1998, Vol. 7 ›› Issue (8): 613-617.doi: 10.1088/1004-423X/7/8/009

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OSCILLATORY INTERLAYER COUPLING WITH Cu AND Zr UNDERLAYER THICKNESS FOR Co/Cu MULTILAYERS

单郑生1, D. J. Sellmyer1, 沈保根2, 赵见高2, 赵同云3   

  1. (1)Behlen Laboratory of Physics and Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE 68588-0113, USA; (2)State Key Laboratory for Magnetism, Institute of Physics, Academia Sinica, Beijing 100080, China; (3)State Key Laboratory for Magnetism, Institute of Physics, Academia Sinica, Beijing 100080, China; Behlen Laboratory of Physics and Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE 68588-0113, USA; Department of Physics, Wuh
  • 收稿日期:1997-12-02 修回日期:1998-02-25 出版日期:1998-08-20 发布日期:1998-08-20
  • 基金资助:
    Project supported in part by the U.S. National Sciences Foundation and the National Natural Science Foundation of China.

OSCILLATORY INTERLAYER COUPLING WITH Cu AND Zr UNDERLAYER THICKNESS FOR Co/Cu MULTILAYERS

Zhao Tong-yun (赵同云)abc, Shan Zheng-sheng (单郑生)b, Shen Bao-gen (沈保根)a, Zhao Jian-gao (赵见高)a, D. J. Sellmyerb   

  1. a State Key Laboratory for Magnetism, Institute of Physics, Academia Sinica, Beijing 100080, China; b Behlen Laboratory of Physics and Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE 68588-0113, USA; c Department of Physics, Wuhan University, Wuhan 430072, China
  • Received:1997-12-02 Revised:1998-02-25 Online:1998-08-20 Published:1998-08-20
  • Supported by:
    Project supported in part by the U.S. National Sciences Foundation and the National Natural Science Foundation of China.

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摘要： Oscillatory behavior (with a period of about 9 nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.

Abstract: Oscillatory behavior (with a period of about 9 nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.

中图分类号:  (Magnetic properties of interfaces (multilayers, superlattices, heterostructures))

  • 75.70.Cn
68.65.Ac (Multilayers) 75.50.Ee (Antiferromagnetics) 75.47.Np (Metals and alloys) 68.55.-a (Thin film structure and morphology)