中国物理B ›› 2014, Vol. 23 ›› Issue (5): 57504-057504.doi: 10.1088/1674-1056/23/5/057504

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

A new aluminum iron oxide Schottky photodiode designed via sol-gel coating method

A. Tataroğlua, A. A. Hendib, R. H. Alorainyb, F. Yakuphanoğluc   

  1. a Department of Physics, Faculty of Science, Gazi University, Ankara, Turkey;
    b Physics Department, Sciences Faculty for Girls, King Abdulaziz University, Jeddah, Saudi Arabia;
    c Department of Physics, Faculty of Science, Firat University, Elaziğ, Turkey
  • 收稿日期:2013-07-11 修回日期:2013-11-20 出版日期:2014-05-15 发布日期:2014-05-15

A new aluminum iron oxide Schottky photodiode designed via sol-gel coating method

A. Tataroğlua, A. A. Hendib, R. H. Alorainyb, F. Yakuphanoğluc   

  1. a Department of Physics, Faculty of Science, Gazi University, Ankara, Turkey;
    b Physics Department, Sciences Faculty for Girls, King Abdulaziz University, Jeddah, Saudi Arabia;
    c Department of Physics, Faculty of Science, Firat University, Elaziğ, Turkey
  • Received:2013-07-11 Revised:2013-11-20 Online:2014-05-15 Published:2014-05-15
  • Contact: A. Tataroğlu E-mail:ademt@gazi.edu.tr
  • About author:75.50.Gg; 85.60.Dw; 84.37.+q; 73.30.+y

摘要: A novel aluminum iron oxide (Al/AlFe2O4/p-Si) Schottky photodiode was successfully fabricated via the sol-gel coating process. The microstructure of the spinel ferrite (AlFe2O4) was examined by atomic force microscopy. The current-voltage characteristics of the fabricated photodiode were studied under dark and different illumination conditions at room temperature. By using the thermionic emission theory, the forward bias I-V characteristics of the photodiode are analyzed to determine the main electrical parameters such as the ideality factor (n) and barrier height (ΦB0) of the photodiode. The values of n and ΦB0 for all conditions are found to be about 7.00 and 0.76 eV, respectively. In addition, the values of series resistance (Rs) are determined using Cheung's method and Ohm's law. The values of Rs and shunt resistance (Rsh) are decreased with the increase of illumination intensity. These new spinel ferrites will open a new avenue to other spinel structure materials for optoelectronic devices in the near future.

关键词: spinel ferrite, Schottky photodiode, I-V characteristics, barrier height

Abstract: A novel aluminum iron oxide (Al/AlFe2O4/p-Si) Schottky photodiode was successfully fabricated via the sol-gel coating process. The microstructure of the spinel ferrite (AlFe2O4) was examined by atomic force microscopy. The current-voltage characteristics of the fabricated photodiode were studied under dark and different illumination conditions at room temperature. By using the thermionic emission theory, the forward bias I-V characteristics of the photodiode are analyzed to determine the main electrical parameters such as the ideality factor (n) and barrier height (ΦB0) of the photodiode. The values of n and ΦB0 for all conditions are found to be about 7.00 and 0.76 eV, respectively. In addition, the values of series resistance (Rs) are determined using Cheung's method and Ohm's law. The values of Rs and shunt resistance (Rsh) are decreased with the increase of illumination intensity. These new spinel ferrites will open a new avenue to other spinel structure materials for optoelectronic devices in the near future.

Key words: spinel ferrite, Schottky photodiode, I-V characteristics, barrier height

中图分类号:  (Ferrimagnetics)

  • 75.50.Gg
85.60.Dw (Photodiodes; phototransistors; photoresistors) 84.37.+q (Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)) 73.30.+y (Surface double layers, Schottky barriers, and work functions)