中国物理B ›› 2025, Vol. 34 ›› Issue (8): 86101-086101.doi: 10.1088/1674-1056/adcea2
所属专题: SPECIAL TOPIC — Structures and properties of materials under high pressure
Zelong Wang(王泽龙)1,†, Guodong Wang(王国东)2,†, Wenmin Li(李文敏)3,†, Runteng Chen(陈润滕)2, Lei Duan(段磊)2, Jianfa Zhao(赵建发)2,4, Zheng Deng(邓正)2,4, Jianfeng Zhang(张建丰)2,4,§, Tingjiang Yan(颜廷江)1,¶, Jun Zhang(张俊)2,4,‡, Xiancheng Wang(望贤成)2,4, and Changqing Jin(靳常青)2,4,#
Zelong Wang(王泽龙)1,†, Guodong Wang(王国东)2,†, Wenmin Li(李文敏)3,†, Runteng Chen(陈润滕)2, Lei Duan(段磊)2, Jianfa Zhao(赵建发)2,4, Zheng Deng(邓正)2,4, Jianfeng Zhang(张建丰)2,4,§, Tingjiang Yan(颜廷江)1,¶, Jun Zhang(张俊)2,4,‡, Xiancheng Wang(望贤成)2,4, and Changqing Jin(靳常青)2,4,#
摘要: Quasi one-dimensional polycrystalline samples of Ba$_{3}$Hf(Se$_{1-x}$Te$_{x}$)$_{5}$ ($x = 0$-1) are synthesized under high-temperature and high-pressure conditions. Using the powder x-ray diffraction technique and first-principles calculations, Ba$_{3}$HfSe$_{5}$ is identified as having a hexagonal structure with a space group of $P$6$_{3}$/mcm (193) and lattice constants of $a = 9.5756(1) $ Å, $c =6.3802(7) $ Å. The structure is composed of Hf(Se$_{1}$)$_{6}$ chains and Se$_{2}$ linear chains extending along the $c$-axis. As the doping content of Te increases, the lattice expands and leads to 5.8% and 7.3% increases of the $a$ and $c$ values and a 20.1% increase of the unit cell volume of Ba$_{3}$HfTe$_{5}$ compared to Ba$_{3}$HfSe$_{5}$. The detailed structural refinements show that the Hf vacancies decrease gradually as Te doping increases in the Ba$_{3}$Hf(Se$_{1-x}$Te$_{x}$)$_{5}$ ($x = 0$-1) materials, which leads to a decrease of electronic localization. In addition, the lower electronegativity of Te and the more extended orbitals with respect to Se contribute to orbital overlap between the inter chains. All these dominate the enhanced electron hopping, leading to a reduction of the bandgap from 1.95 eV to 0.23 eV for Ba$_{3}$Hf(Se$_{1-x}$Te$_{x}$)$_{5}$ ($x = 0$-1) materials as the Ba$_{3}$HfSe$_{5}$ evolves to Ba$_{3}$HfTe$_{5}$.
中图分类号: (X-ray diffraction)