中国物理B ›› 2023, Vol. 32 ›› Issue (4): 47901-047901.doi: 10.1088/1674-1056/ac904b

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Effects of O2 adsorption on secondary electron emission properties

Zhao-Lun Yang(杨兆伦)1,2, Jing Yang(杨晶)2, Yun He(何鋆)2, Tian-Cun Hu(胡天存)2, Xin-Bo Wang(王新波)2, Na Zhang(张娜)2, Ze-Yu Chen(陈泽煜)2, Guang-Hui Miao(苗光辉)2, Yu-Ting Zhang(张雨婷)2, and Wan-Zhao Cui(崔万照)1,2,†   

  1. 1 College of Aeronautics, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China;
    2 National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology(Xi'an), Xi'an 710100, China
  • 收稿日期:2022-07-25 修回日期:2022-08-29 接受日期:2022-09-08 出版日期:2023-03-10 发布日期:2023-03-30
  • 通讯作者: Wan-Zhao Cui E-mail:cuiwanzhao@126.com
  • 基金资助:
    Project supported by the Fund from the National Key Laboratory of Science and Technology on Space Mircrowave, China (Grant No. 6142411112205) and the National Natural Science Foundation of China (Grant No. 62001376).

Effects of O2 adsorption on secondary electron emission properties

Zhao-Lun Yang(杨兆伦)1,2, Jing Yang(杨晶)2, Yun He(何鋆)2, Tian-Cun Hu(胡天存)2, Xin-Bo Wang(王新波)2, Na Zhang(张娜)2, Ze-Yu Chen(陈泽煜)2, Guang-Hui Miao(苗光辉)2, Yu-Ting Zhang(张雨婷)2, and Wan-Zhao Cui(崔万照)1,2,†   

  1. 1 College of Aeronautics, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China;
    2 National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology(Xi'an), Xi'an 710100, China
  • Received:2022-07-25 Revised:2022-08-29 Accepted:2022-09-08 Online:2023-03-10 Published:2023-03-30
  • Contact: Wan-Zhao Cui E-mail:cuiwanzhao@126.com
  • Supported by:
    Project supported by the Fund from the National Key Laboratory of Science and Technology on Space Mircrowave, China (Grant No. 6142411112205) and the National Natural Science Foundation of China (Grant No. 62001376).

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摘要： The surface adsorption of gas molecules is a key factor limiting the secondary electron yield (SEY) of a material in many areas of applied physics. The influence of O2 adsorption on the SEY of metallic Ag is investigated in this work. To account for the particle distribution, we propose a BET theory based on multilayer O2 physisorption model. Furthermore, based on the phenomenological model of secondary electron (SE) emission and by taking into account the different scattering processes between electrons and particles in the adsorbed layer, we develop a numerical model of SEY in the adsorbed state using Monte Carlo simulations. The relationships among O2 adsorption, adsorption layer thickness, and SEY variation characteristics are then examined through a series of experiments. After 12-h exposure to O2, the clean samples increases 12%-19% of the maximum value of SEY and 2.3 nm in thickness of the adsorbed layer. Experimental results are also compared with the results from the MC model to determine whether the model is accurate.

关键词: multilayer adsorption model, secondary electron, Monte Carlo simulation, gas adsorption experiments

Abstract: The surface adsorption of gas molecules is a key factor limiting the secondary electron yield (SEY) of a material in many areas of applied physics. The influence of O2 adsorption on the SEY of metallic Ag is investigated in this work. To account for the particle distribution, we propose a BET theory based on multilayer O2 physisorption model. Furthermore, based on the phenomenological model of secondary electron (SE) emission and by taking into account the different scattering processes between electrons and particles in the adsorbed layer, we develop a numerical model of SEY in the adsorbed state using Monte Carlo simulations. The relationships among O2 adsorption, adsorption layer thickness, and SEY variation characteristics are then examined through a series of experiments. After 12-h exposure to O2, the clean samples increases 12%-19% of the maximum value of SEY and 2.3 nm in thickness of the adsorbed layer. Experimental results are also compared with the results from the MC model to determine whether the model is accurate.

Key words: multilayer adsorption model, secondary electron, Monte Carlo simulation, gas adsorption experiments

中图分类号:  (Electron impact: secondary emission)

  • 79.20.Hx
79.60.Dp (Adsorbed layers and thin films)