中国物理B ›› 2019, Vol. 28 ›› Issue (6): 66804-066804.doi: 10.1088/1674-1056/28/6/066804

• CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES • 上一篇    下一篇

Temperature-dependent subband mobility characteristics in n-doped silicon junctionless nanowire transistor

Ya-Mei Dou(窦亚梅), Wei-Hua Han(韩伟华), Yang-Yan Guo(郭仰岩), Xiao-Song Zhao(赵晓松), Xiao-Di Zhang(张晓迪), Xin-Yu Wu(吴歆宇), Fu-Hua Yang(杨富华)   

  1. 1 Engineering Research Center for Semiconductor Integration Technology & Beijing Engineering Center of Semiconductor Micro-Nano Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
    2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China;
    3 State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 收稿日期:2019-03-06 修回日期:2019-03-29 出版日期:2019-06-05 发布日期:2019-06-05
  • 通讯作者: Wei-Hua Han E-mail:weihua@semi.ac.cn
  • 基金资助:

    Project supported by the National Key Research and Development Program of China (Grant No. 2016YFA0200503).

Temperature-dependent subband mobility characteristics in n-doped silicon junctionless nanowire transistor

Ya-Mei Dou(窦亚梅)1,2, Wei-Hua Han(韩伟华)1,2, Yang-Yan Guo(郭仰岩)1,2, Xiao-Song Zhao(赵晓松)1,2, Xiao-Di Zhang(张晓迪)1,2, Xin-Yu Wu(吴歆宇)1,2, Fu-Hua Yang(杨富华)1,2,3   

  1. 1 Engineering Research Center for Semiconductor Integration Technology & Beijing Engineering Center of Semiconductor Micro-Nano Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;
    2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China;
    3 State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • Received:2019-03-06 Revised:2019-03-29 Online:2019-06-05 Published:2019-06-05
  • Contact: Wei-Hua Han E-mail:weihua@semi.ac.cn
  • Supported by:

    Project supported by the National Key Research and Development Program of China (Grant No. 2016YFA0200503).

摘要:

We have investigated the temperature-dependent effective mobility characteristics in impurity band and conduction subbands of n-doped silicon junctionless nanowire transistors. It is found that the electron effective mobility of the first subband in 2-fold valleys is higher than that of the second subband in 4-fold valleys. There exists a maximum value for the effective subband mobilities at low temperatures, which is attributed to the increase of thermally activated electrons from the ionized donors in the impurity band. The experimental results indicate that the effective subband mobility is temperature-dependent on the electron interactions by thermal activation, impurity scattering, and intersubband scattering.

关键词: effective subband mobility, thermal activation, Coulomb scattering, silicon nanowire transistor

Abstract:

We have investigated the temperature-dependent effective mobility characteristics in impurity band and conduction subbands of n-doped silicon junctionless nanowire transistors. It is found that the electron effective mobility of the first subband in 2-fold valleys is higher than that of the second subband in 4-fold valleys. There exists a maximum value for the effective subband mobilities at low temperatures, which is attributed to the increase of thermally activated electrons from the ionized donors in the impurity band. The experimental results indicate that the effective subband mobility is temperature-dependent on the electron interactions by thermal activation, impurity scattering, and intersubband scattering.

Key words: effective subband mobility, thermal activation, Coulomb scattering, silicon nanowire transistor

中图分类号:  (Quantum wires (patterned in quantum wells))

  • 68.65.La
68.65.Hb (Quantum dots (patterned in quantum wells)) 05.60.Gg (Quantum transport) 11.40.-q (Currents and their properties)