中国物理B ›› 2018, Vol. 27 ›› Issue (3): 38401-038401.doi: 10.1088/1674-1056/27/3/038401
• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇 下一篇
Wan-Zhao Cui(崔万照), Heng Zhang(张恒), Yun Li(李韵), Yun He(何鋆), Qi Wang(王琪), Hong-Tai Zhang(张洪太), Hong-Guang Wang(王洪广), Jing Yang(杨晶)
Wan-Zhao Cui(崔万照)1, Heng Zhang(张恒)1, Yun Li(李韵)1, Yun He(何鋆)1, Qi Wang(王琪)1, Hong-Tai Zhang(张洪太)1, Hong-Guang Wang(王洪广)2, Jing Yang(杨晶)1
摘要: Secondary electron emission (SEE) of metal and dielectric materials plays a key role in multipactor discharge, which is a bottle neck problem for high-power satelliate components. Measurements of both the secondary electron yield (SEY) and the secondary electron energy spectrum (SES) are performed on metal samples for an accurate description of the real SEE phenomenon. In order to simplify the fitting process and improve the simulation efficiency, an improved model is proposed for the description of secondary electrons (SE) emitted from the material surface, including true, elastic, and inelastic SE. Embedding the novel SES model into the electromagnetic particle-in-cell method, the electronic resonant multipactor in microwave components is simulated successfully and hence the discharge threshold is predicted. Simulation results of the SES variation in the improved model demonstrate that the multipactor threshold is strongly dependent on SES. In addition, the mutipactor simulation results agree quite well with the experiment for the practical microwave component, while the numerical model of SEY and SES fits well with the sample data taken from the microwave component.
中图分类号: (Passive circuit components)