中国物理B ›› 2015, Vol. 24 ›› Issue (7): 76803-076803.doi: 10.1088/1674-1056/24/7/076803
• CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES • 上一篇 下一篇
New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy
何小川a, 杨建兵b, 闫东航b, 翁羽翔a
- a Laboratory of Soft Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
b State Key Laboratory of Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China
New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy
He Xiao-Chuan (何小川)a, Yang Jian-Bing (杨建兵)b, Yan Dong-Hang (闫东航)b, Weng Yu-Xiang (翁羽翔)a
- a Laboratory of Soft Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
b State Key Laboratory of Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China
摘要：
A new method to visualize the large-scale crystal grain morphology of organic polycrystalline films is proposed. First, optical anisotropic transmittance images of polycrystalline zinc phthalocyanine (ZnPc) films vacuum deposited by weak epitaxial growth (WEG) method were acquired with polarized optical microscopy (POM). Then morphology properties including crystal grain size, distribution, relative orientation, and crystallinity were derived from these images by fitting with a transition dipole model. At last, atomic force microscopy (AFM) imaging was carried out to confirm the fitting and serve as absolute references. This method can be readily generalized to other organic polycrystalline films, thus providing an efficient way to access the large-scale morphologic properties of organic polycrystalline films, which may prove to be useful in industry as a film quality monitoring method.
中图分类号: (Morphology of films)
- 68.55.J-