中国物理B ›› 2011, Vol. 20 ›› Issue (10): 108103-108103.doi: 10.1088/1674-1056/20/10/108103

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Enhanced etching of silicon dioxide guided by carbon nanotubes in HF solution

魏芹芹1, 傅云义1, 魏子钧1, 张岩2, 李彦2, 赵华波3, 应轶群3, 严峰3, 张朝晖3   

  1. (1)Department of Microelectronics, Peking University, Beijing 100871, China; (2)Key Laboratory for Physics and Chemistry of Nanodevices, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China; (3)State Key Laboratory for Artificial Microstructures and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China
  • 收稿日期:2011-05-11 修回日期:2011-06-09 出版日期:2011-10-15 发布日期:2011-10-15
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 90406007, 61076069, 60776053, and 10434010) and the National Basic Research Program of China (Grant No. 2007CB936800).

Enhanced etching of silicon dioxide guided by carbon nanotubes in HF solution

Zhao Hua-Bo(赵华波)a), Ying Alex Yi-Qun(应轶群)a), Yan Feng(严峰)a), Wei Qin-Qin(魏芹芹)c), Fu Yun-Yi(傅云义)c), Zhang Yan(张岩)b), Li Yan(李彦)b), Wei Zi-Jun(魏子钧)c), and Zhang Zhao-Hui(张朝晖)a)   

  1. a State Key Laboratory for Artificial Microstructures and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China; b Key Laboratory for Physics and Chemistry of Nanodevices, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China; c Department of Microelectronics, Peking University, Beijing 100871, China
  • Received:2011-05-11 Revised:2011-06-09 Online:2011-10-15 Published:2011-10-15
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 90406007, 61076069, 60776053, and 10434010) and the National Basic Research Program of China (Grant No. 2007CB936800).

摘要: This paper describes a new method to create nanoscale SiO2 pits or channels using single-walled carbon nanotubes (SWNTs) in an HF solution at room temperature within a few seconds. Using aligned SWNT arrays, a pattern of nanoscale SiO2 channels can be prepared. The nanoscale SiO2 patterns can also be created on the surface of three-dimensional (3D) SiO2 substrate and even the nanoscale trenches can be constructed with arbitrary shapes. A possible mechanism for this enhanced etching of SiO2 has been qualitatively analysed using defects in SWNTs, combined with H3O+ electric double layers around SWNTs in an HF solution.

关键词: carbon nanotube, silicon dioxide, HF wet etching, defects and electric double layers

Abstract: This paper describes a new method to create nanoscale SiO2 pits or channels using single-walled carbon nanotubes (SWNTs) in an HF solution at room temperature within a few seconds. Using aligned SWNT arrays, a pattern of nanoscale SiO2 channels can be prepared. The nanoscale SiO2 patterns can also be created on the surface of three-dimensional (3D) SiO2 substrate and even the nanoscale trenches can be constructed with arbitrary shapes. A possible mechanism for this enhanced etching of SiO2 has been qualitatively analysed using defects in SWNTs, combined with H3O+ electric double layers around SWNTs in an HF solution.

Key words: carbon nanotube, silicon dioxide, HF wet etching, defects and electric double layers

中图分类号:  (Micro- and nanoscale pattern formation)

  • 81.16.Rf
82.45.Jn (Surface structure, reactivity and catalysis) 81.65.Cf (Surface cleaning, etching, patterning) 82.37.Gk (STM and AFM manipulations of a single molecule)