中国物理B ›› 2010, Vol. 19 ›› Issue (1): 18101-018101.doi: 10.1088/1674-1056/19/1/018101
赵璐冰, 于彤军, 吴洁君, 杨志坚, 张国义
Zhao Lu-Bing(赵璐冰), Yu Tong-Jun(于彤军)†, Wu Jie-Jun(吴洁君), Yang Zhi-Jian(杨志坚), and Zhang Guo-Yi(张国义)
摘要: Non-polar a-plane (1$1\bar{2}$0) GaN films have been grown on r-plane (1$\bar{1}$02) sapphire substrates by metal organic chemical vapour deposition. The influences of V/III ratio on the species diffusion anisotropy of a-plane GaN films were investigated by scanning electron microscopy, cathodoluminescence and high-resolution x-ray diffraction measurements. The anisotropy of a-plane GaN films may result from the different migration length of adatoms along two in-plane directions. V/III ratio has an effect on the growth rates of different facets and crystal quality. The stripe feature morphology was obviously observed in the film with a high V/III ratio because of the slow growth rate along the [1$\bar{1}$00] direction. When the V/III ratio increased from 1000 to 6000, the in-plane crystal quality anisotropy was decreased due to the weakened predominance in migration length of gallium adatoms.
中图分类号: (Diffusion of adsorbates, kinetics of coarsening and aggregation)