中国物理B ›› 2005, Vol. 14 ›› Issue (11): 2335-2337.doi: 10.1088/1009-1963/14/11/032
杨莺歌, 刘丕均, 王英, 张亚非
Yang Ying-Ge (杨莺歌), Liu Pi-Jun (刘丕均), Wang Ying (王英), Zhang Ya-Fei (张亚非)
摘要: TiO$_{2}$ thin films were deposited on glass substrates by sputtering in a conventional rf magnetron sputtering system. X-ray diffraction pattern and transmission spectrum were measured. The curves of refraction index and extinction coefficient distributions as well as the thickness of films calculated from transmission spectrum were obtained. The optimization problem was also solved using a method based on a constrained nonlinear programming algorithm.
中图分类号: (Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))