High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency

doi:10.1088/1674-1056/abf0fd

中国物理B ›› 2021, Vol. 30 ›› Issue (9): 94202-094202.doi: 10.1088/1674-1056/abf0fd

High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency

Abdul Wahab^1,2,†

1 National Laboratory for Physical Sciences at Microscale, Shanghai Branch, University of Science and Technology of China, Shanghai 201315, China;
2 CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China

收稿日期:2020-11-15 修回日期:2021-02-28 接受日期:2021-03-23 出版日期:2021-08-19 发布日期:2021-08-19
通讯作者: Abdul Wahab E-mail:abdulwahab@mail.ustc.edu.cn,jadoon009@outlook.com

High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency

Abdul Wahab^1,2,†

1 National Laboratory for Physical Sciences at Microscale, Shanghai Branch, University of Science and Technology of China, Shanghai 201315, China;
2 CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China

Received:2020-11-15 Revised:2021-02-28 Accepted:2021-03-23 Online:2021-08-19 Published:2021-08-19
Contact: Abdul Wahab E-mail:abdulwahab@mail.ustc.edu.cn,jadoon009@outlook.com

摘要/Abstract

摘要： We aim to present a new scheme for high-dimensional atomic microscopy via double electromagnetically induced transparency in a four-level tripod system. For atom-field interaction, we construct a spatially dependent field by superimposing three standing-wave fields (SWFs) in 3D-atom localization. We achieve a high precision and high spatial resolution of an atom localization by appropriately adjusting the system variables such as field intensities and phase shifts. We also see the impact of Doppler shift and show that it dramatically deteriorates the precision of spatial information on 3D-atom localization. We believe that our suggested scheme opens up a fascinating way to improve the atom localization that supplies some practical applications in atom nanolithography, and Bose-Einstein condensation.

关键词: electromagnetically induced transparency, transparency windows

Abstract: We aim to present a new scheme for high-dimensional atomic microscopy via double electromagnetically induced transparency in a four-level tripod system. For atom-field interaction, we construct a spatially dependent field by superimposing three standing-wave fields (SWFs) in 3D-atom localization. We achieve a high precision and high spatial resolution of an atom localization by appropriately adjusting the system variables such as field intensities and phase shifts. We also see the impact of Doppler shift and show that it dramatically deteriorates the precision of spatial information on 3D-atom localization. We believe that our suggested scheme opens up a fascinating way to improve the atom localization that supplies some practical applications in atom nanolithography, and Bose-Einstein condensation.

Key words: electromagnetically induced transparency, transparency windows

中图分类号: (Effects of atomic coherence on propagation, absorption, and Amplification of light; electromagnetically induced transparency and Absorption)

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Abdul Wahab. High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency[J]. 中国物理B, 2021, 30(9): 94202-094202.

Abdul Wahab. High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency[J]. Chin. Phys. B, 2021, 30(9): 94202-094202.

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High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency

High-resolution three-dimensional atomic microscopy via double electromagnetically induced transparency

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