中国物理B ›› 2017, Vol. 26 ›› Issue (9): 97301-097301.doi: 10.1088/1674-1056/26/9/097301

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

Application of real space Kerker method in simulating gate-all-around nanowire transistors with realistic discrete dopants

Chang-Sheng Li(李长生), Lei Ma(马磊), Jie-Rong Guo(郭杰荣)   

  1. Department of Physics and Electronic Sciences, Hunan University of Arts and Science, Changde 415000, China
  • 收稿日期:2017-04-02 修回日期:2017-06-12 出版日期:2017-09-05 发布日期:2017-09-05
  • 通讯作者: Chang-Sheng Li E-mail:lcs135@163.com
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 11104069).

Application of real space Kerker method in simulating gate-all-around nanowire transistors with realistic discrete dopants

Chang-Sheng Li(李长生), Lei Ma(马磊), Jie-Rong Guo(郭杰荣)   

  1. Department of Physics and Electronic Sciences, Hunan University of Arts and Science, Changde 415000, China
  • Received:2017-04-02 Revised:2017-06-12 Online:2017-09-05 Published:2017-09-05
  • Contact: Chang-Sheng Li E-mail:lcs135@163.com
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 11104069).

摘要: We adopt a self-consistent real space Kerker method to prevent the divergence from charge sloshing in the simulating transistors with realistic discrete dopants in the source and drain regions. The method achieves efficient convergence by avoiding unrealistic long range charge sloshing but keeping effects from short range charge sloshing. Numerical results show that discrete dopants in the source and drain regions could have a bigger influence on the electrical variability than the usual continuous doping without considering charge sloshing. Few discrete dopants and the narrow geometry create a situation with short range Coulomb screening and oscillations of charge density in real space. The dopants induced quasi-localized defect modes in the source region experience short range oscillations in order to reach the drain end of the device. The charging of the defect modes and the oscillations of the charge density are identified by the simulation of the electron density.

关键词: electron transport, nanowire transistor, non-equilibrium Green', s function, dopant

Abstract: We adopt a self-consistent real space Kerker method to prevent the divergence from charge sloshing in the simulating transistors with realistic discrete dopants in the source and drain regions. The method achieves efficient convergence by avoiding unrealistic long range charge sloshing but keeping effects from short range charge sloshing. Numerical results show that discrete dopants in the source and drain regions could have a bigger influence on the electrical variability than the usual continuous doping without considering charge sloshing. Few discrete dopants and the narrow geometry create a situation with short range Coulomb screening and oscillations of charge density in real space. The dopants induced quasi-localized defect modes in the source region experience short range oscillations in order to reach the drain end of the device. The charging of the defect modes and the oscillations of the charge density are identified by the simulation of the electron density.

Key words: electron transport, nanowire transistor, non-equilibrium Green's function, dopant

中图分类号:  (Electronic transport in mesoscopic systems)

  • 73.23.-b
73.63.-b (Electronic transport in nanoscale materials and structures) 72.10.Fk (Scattering by point defects, dislocations, surfaces, and other imperfections (including Kondo effect))