中国物理B ›› 2014, Vol. 23 ›› Issue (3): 37801-037801.doi: 10.1088/1674-1056/23/3/037801
• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇 下一篇
武颖丽, 吴振森
Wu Ying-Li (武颖丽), Wu Zhen-Sen (吴振森)
摘要: Speckle intensity in the detector plane is deduced in the free-space optical system and imaging system based on Van Cittert–Zernike theorem. The speckle intensity images of plane target and conical target are obtained by using the Monte Carlo method and measured experimentally. The results show that when the range extent of target is smaller, the speckle size along the same direction become longer, and the speckle size increase with increasing incident light wavelengths. The speckle size increases and the speckle intensity images of target is closer to the actual object when the aperture scale augments. These findings are useful to access the target information by speckle in laser radar systems.
中图分类号: (Laser ultrasonics)