中国物理B ›› 2011, Vol. 20 ›› Issue (8): 87202-087202.doi: 10.1088/1674-1056/20/8/087202

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Noise analysis and measurement of time delay and integration charge coupled device

张涛1, 王德江2   

  1. (1)Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; (2)Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; Graduate School of the Chinese Academy of Sciences, Beijing 100049, China
  • 收稿日期:2010-12-22 修回日期:2011-04-06 出版日期:2011-08-15 发布日期:2011-08-15
  • 基金资助:
    Project supported by the National High Technology Research and Development Program of China (Grant No. 2006AA06A208).

Noise analysis and measurement of time delay and integration charge coupled device

Wang De-Jiang(王德江)a)b)† and Zhang Tao(张涛)a)   

  1. a Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; b Graduate School of the Chinese Academy of Sciences, Beijing 100049, China
  • Received:2010-12-22 Revised:2011-04-06 Online:2011-08-15 Published:2011-08-15
  • Supported by:
    Project supported by the National High Technology Research and Development Program of China (Grant No. 2006AA06A208).

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摘要： Time delay and integration (TDI) charge coupled device (CCD) noise sets a fundamental limit on image sensor performance, especially under low illumination in remote sensing applications. After introducing the complete sources of CCD noise, we study the effects of TDI operation mode on noise, and the relationship between different types of noise and number of the TDI stage. Then we propose a new technique to identify and measure sources of TDI CCD noise employing mathematical statistics theory, where theoretical analysis shows that noise estimated formulation converges well. Finally, we establish a testing platform to carry out experiments, and a standard TDI CCD is calibrated by using the proposed method. The experimental results show that the noise analysis and measurement methods presented in this paper are useful for modeling TDI CCDs.

关键词: time delay and integration charge coupled device, noise measurement, remote sensing application

Abstract: Time delay and integration (TDI) charge coupled device (CCD) noise sets a fundamental limit on image sensor performance, especially under low illumination in remote sensing applications. After introducing the complete sources of CCD noise, we study the effects of TDI operation mode on noise, and the relationship between different types of noise and number of the TDI stage. Then we propose a new technique to identify and measure sources of TDI CCD noise employing mathematical statistics theory, where theoretical analysis shows that noise estimated formulation converges well. Finally, we establish a testing platform to carry out experiments, and a standard TDI CCD is calibrated by using the proposed method. The experimental results show that the noise analysis and measurement methods presented in this paper are useful for modeling TDI CCDs.

Key words: time delay and integration charge coupled device, noise measurement, remote sensing application

中图分类号:  (Noise processes and phenomena)

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