中国物理B ›› 2004, Vol. 13 ›› Issue (1): 65-70.doi: 10.1088/1009-1963/13/1/013
王久丽1, 张谷令1, 刘元富1, 刘赤子1, 杨思泽2, 王友年3
Wang Jiu-Li (王久丽)a, Zhang Gu-Ling (张谷令)a, Liu Yuan-Fu (刘元富)a, Wang You-Nian (王友年)b, Liu Chi-Zi (刘赤子)a, Yang Si-Ze (杨思泽)ab
摘要: Grid-enhanced plasma source ion implantation (GEPSII) is a newly proposed technique to modify the inner-surface properties of a cylindrical bore. In this paper, a two-ion fluid model describing nitrogen molecular ions N_2^+ and atomic ions N^+ is used to investigate the ion sheath dynamics between the grid electrode and the inner surface of a cylindrical bore during the GEPSII process, which is an extension of our previous calculations in which only N_2^+ was considered. Calculations are concentrated on the results of ion dose and impact energy on the target for different ion species ratios in the core plasma. The calculated results show that more atomic ions N^+ in the core plasma can raise the ion impact energy and reduce the ion dose on the target.
中图分类号: (Plasma sources)