中国物理B ›› 2024, Vol. 33 ›› Issue (9): 95202-095202.doi: 10.1088/1674-1056/ad5c3d
Ao Xu(徐翱), Pingping Gan(甘娉娉)†, Xiang Wan(万翔), and Yuanjie Shi(石元杰)
Ao Xu(徐翱), Pingping Gan(甘娉娉)†, Xiang Wan(万翔), and Yuanjie Shi(石元杰)
摘要: The spatial distributions of different kinds of ions are usually not completely the same in the process of extracting. In order to study the reason for the different characteristics of ion extraction, a simplified simulation model of Cu$^{+}$ and Cr$^{+}$ ions extraction process was established by 2D3V (two-dimensional in space and three-dimensional in velocity space) particle-in-cell (PIC) method. The effects of different extraction voltages from 0 V to 500 V on the density distribution of Cu$^{+}$ and Cr$^{+}$ ions and the change of plasma emission surface were analyzed. On the basis of this model, the ion density distribution characteristics of Cu$^{+}$ ions mixed with Li$^{+}$, Mg$^{+}$, K$^{+}$, Fe$^{+}$, Y$^{+}$, Ag$^{+}$, Xe$^{+}$, Au$^{+}$, and Pb$^{+}$ ions respectively under 200-V extraction voltage are further simulated, and it is revealed that the atomic mass of the ions is the key reason for different ion density distributions when different kinds of ions are mixed and extracted, which provides support for further understanding of ion extraction characteristics.
中图分类号: (Plasma simulation)