Improvement of femtosecond SPPs imaging by two-color laser photoemission electron microscopy

doi:10.1088/1674-1056/ac6ede

中国物理B ›› 2022, Vol. 31 ›› Issue (10): 107103-107103.doi: 10.1088/1674-1056/ac6ede

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇下一篇

Improvement of femtosecond SPPs imaging by two-color laser photoemission electron microscopy

Chun-Lai Fu(付春来), Zhen-Long Zhao(赵振龙), Bo-Yu Ji(季博宇)^†, Xiao-Wei Song(宋晓伟)^‡, Peng Lang(郎鹏), and Jing-Quan Lin(林景全)

School of Physics, Changchun University of Science and Technology, Changchun 130022, China

收稿日期:2022-03-02 修回日期:2022-05-06 出版日期:2022-10-16 发布日期:2022-09-30
通讯作者: Bo-Yu Ji, Xiao-Wei Song E-mail:jiboyu@cust.edu.cn;songxiaowei@cust.edu.cn
基金资助:
Project supported by the National Natural Science Foundation of China (Grant Nos. 62005022 and 12004052), the Fund from the Jilin Provincial Key Laboratory of Ultrafast and Extreme Ultraviolet Optics, China (Grant No. YDZJ202102CXJD028), the Fund from the Department of Science and Technology of Jilin Province, China (Grant Nos. 20200201268JC and 20200401052GX), the “111” Project of China (Grant No. D17017), and the Fund from the Ministry of Education Key Laboratory for Cross-Scale Microand Nano-Manufacturing, Changchun University of Science and Technology, China.

Improvement of femtosecond SPPs imaging by two-color laser photoemission electron microscopy

Chun-Lai Fu(付春来), Zhen-Long Zhao(赵振龙), Bo-Yu Ji(季博宇)^†, Xiao-Wei Song(宋晓伟)^‡, Peng Lang(郎鹏), and Jing-Quan Lin(林景全)

School of Physics, Changchun University of Science and Technology, Changchun 130022, China

Received:2022-03-02 Revised:2022-05-06 Online:2022-10-16 Published:2022-09-30
Contact: Bo-Yu Ji, Xiao-Wei Song E-mail:jiboyu@cust.edu.cn;songxiaowei@cust.edu.cn
Supported by:
Project supported by the National Natural Science Foundation of China (Grant Nos. 62005022 and 12004052), the Fund from the Jilin Provincial Key Laboratory of Ultrafast and Extreme Ultraviolet Optics, China (Grant No. YDZJ202102CXJD028), the Fund from the Department of Science and Technology of Jilin Province, China (Grant Nos. 20200201268JC and 20200401052GX), the “111” Project of China (Grant No. D17017), and the Fund from the Ministry of Education Key Laboratory for Cross-Scale Microand Nano-Manufacturing, Changchun University of Science and Technology, China.

摘要/Abstract

摘要： Clear imaging of surface plasmon polaritons (SPPs) is a prerequisite for SPPs-based applications. In this work, we demonstrate an improvement of near-field imaging of SPPs via directly comparing the visibility of the photoemission electron microscopy (PEEM) image of SPPs under one- and two-color laser excitation (also known as one- or two-color laser PEEM). By measuring the photoelectron yield and the contrast of the interference fringes of SPPs, we demonstrate that in addition to enhancing the photoemission yield, two-color laser PEEM can significantly improve the contrast between bright and dark fringes (nearly 4 times higher than that of one-color laser case). By recording the nonlinear order of the photoelectrons ejected from the bright and dark fringes, respectively, the underlying mechanism for the improved visibility is revealed. In addition, the influences of the polarization direction of 400-nm laser on the PEEM images of the SPPs with different wave vector directions are shown. These results can provide technical support for the development of SPPs-based communication devices and catalysis.

关键词: surface plasmon polaritons, photoemission electron microscopy, near-field imaging

Abstract: Clear imaging of surface plasmon polaritons (SPPs) is a prerequisite for SPPs-based applications. In this work, we demonstrate an improvement of near-field imaging of SPPs via directly comparing the visibility of the photoemission electron microscopy (PEEM) image of SPPs under one- and two-color laser excitation (also known as one- or two-color laser PEEM). By measuring the photoelectron yield and the contrast of the interference fringes of SPPs, we demonstrate that in addition to enhancing the photoemission yield, two-color laser PEEM can significantly improve the contrast between bright and dark fringes (nearly 4 times higher than that of one-color laser case). By recording the nonlinear order of the photoelectrons ejected from the bright and dark fringes, respectively, the underlying mechanism for the improved visibility is revealed. In addition, the influences of the polarization direction of 400-nm laser on the PEEM images of the SPPs with different wave vector directions are shown. These results can provide technical support for the development of SPPs-based communication devices and catalysis.

Key words: surface plasmon polaritons, photoemission electron microscopy, near-field imaging

中图分类号: (Exchange, correlation, dielectric and magnetic response functions, plasmons)

71.45.Gm

73.20.Mf (Collective excitations (including excitons, polarons, plasmons and other charge-density excitations))

Chun-Lai Fu(付春来), Zhen-Long Zhao(赵振龙), Bo-Yu Ji(季博宇), Xiao-Wei Song(宋晓伟), Peng Lang(郎鹏), and Jing-Quan Lin(林景全). Improvement of femtosecond SPPs imaging by two-color laser photoemission electron microscopy[J]. 中国物理B, 2022, 31(10): 107103-107103.

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Improvement of femtosecond SPPs imaging by two-color laser photoemission electron microscopy

Improvement of femtosecond SPPs imaging by two-color laser photoemission electron microscopy

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