中国物理B ›› 2018, Vol. 27 ›› Issue (3): 33201-033201.doi: 10.1088/1674-1056/27/3/033201

• TOPIC REVIEW—Thermal and thermoelectric properties of nano materials • 上一篇    下一篇

Vapor cell geometry effect on Rydberg atom-based microwave electric field measurement

Linjie Zhang(张临杰), Jiasheng Liu(刘家晟), Yue Jia(贾玥), Hao Zhang(张好), Zhenfei Song(宋振飞), Suotang Jia(贾锁堂)   

  1. 1 Institute of Laser Spectroscopy, State Key Laboratory of Quantum Optics and Quantum Optics Devices, Shanxi University, Taiyuan 030006, China;
    2 Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, China;
    3 National Institute of Metrology, Beijing 100029, China
  • 收稿日期:2017-11-17 修回日期:2018-01-01 出版日期:2018-03-05 发布日期:2018-03-05
  • 通讯作者: Linjie Zhang E-mail:zlj@sxu.edu.cn
  • 基金资助:

    Project supported by the National Key Research and Development Program of China (Grant Nos. 2017YFA03044200 and 2016YFF0200104), the National Natural Science Foundation of China (Grant Nos. 91536110, 61505099, and 61378013), and the Fund for Shanxi "331 Project" Key Subjects Construction, China.

Vapor cell geometry effect on Rydberg atom-based microwave electric field measurement

Linjie Zhang(张临杰)1,2, Jiasheng Liu(刘家晟)1,2, Yue Jia(贾玥)1,2, Hao Zhang(张好)1,2, Zhenfei Song(宋振飞)3, Suotang Jia(贾锁堂)1,2   

  1. 1 Institute of Laser Spectroscopy, State Key Laboratory of Quantum Optics and Quantum Optics Devices, Shanxi University, Taiyuan 030006, China;
    2 Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, China;
    3 National Institute of Metrology, Beijing 100029, China
  • Received:2017-11-17 Revised:2018-01-01 Online:2018-03-05 Published:2018-03-05
  • Contact: Linjie Zhang E-mail:zlj@sxu.edu.cn
  • Supported by:

    Project supported by the National Key Research and Development Program of China (Grant Nos. 2017YFA03044200 and 2016YFF0200104), the National Natural Science Foundation of China (Grant Nos. 91536110, 61505099, and 61378013), and the Fund for Shanxi "331 Project" Key Subjects Construction, China.

摘要:

The geometry effect of a vapor cell on the metrology of a microwave electric field is investigated. Based on the splitting of the electromagnetically induced transparency spectra of cesium Rydberg atoms in a vapor cell, high-resolution spatial distribution of the microwave electric field strength is achieved for both a cubic cell and a cylinder cell. The spatial distribution of the microwave field strength in two dimensions is measured with sub-wavelength resolution. The experimental results show that the shape of a vapor cell has a significant influence on the abnormal spatial distribution because of the Fabry-Pérot effect inside a vapor cell. A theoretical simulation is obtained for different vapor cell wall thicknesses and shows that a restricted wall thickness results in a measurement fluctuation smaller than 3% at the center of the vapor cell.

关键词: Rydberg atom, microwave electric field strength, electromagnetically induced transparency (EIT), Aulter-Towns splitting

Abstract:

The geometry effect of a vapor cell on the metrology of a microwave electric field is investigated. Based on the splitting of the electromagnetically induced transparency spectra of cesium Rydberg atoms in a vapor cell, high-resolution spatial distribution of the microwave electric field strength is achieved for both a cubic cell and a cylinder cell. The spatial distribution of the microwave field strength in two dimensions is measured with sub-wavelength resolution. The experimental results show that the shape of a vapor cell has a significant influence on the abnormal spatial distribution because of the Fabry-Pérot effect inside a vapor cell. A theoretical simulation is obtained for different vapor cell wall thicknesses and shows that a restricted wall thickness results in a measurement fluctuation smaller than 3% at the center of the vapor cell.

Key words: Rydberg atom, microwave electric field strength, electromagnetically induced transparency (EIT), Aulter-Towns splitting

中图分类号:  (Rydberg states)

  • 32.80.Ee
42.50.Gy (Effects of atomic coherence on propagation, absorption, and Amplification of light; electromagnetically induced transparency and Absorption) 84.40.-x (Radiowave and microwave (including millimeter wave) technology)