Backward rescattered photoelectron holography in strong-field ionization

doi:10.1088/1674-1056/27/10/103202

中国物理B ›› 2018, Vol. 27 ›› Issue (10): 103202-103202.doi: 10.1088/1674-1056/27/10/103202

• SPECIAL TOPIC—Recent advances in thermoelectric materials and devices • 上一篇下一篇

Backward rescattered photoelectron holography in strong-field ionization

Fujun Chen(陈富军), Ruxian Yao(姚汝贤), Jianghua Luo(罗江华), Changqing Wang(王长清)

1 School of Information Engineering, Huanghuai University, Zhumadian 463000, China;
2 School of Physics and Optoelectronic Engineering, Yangtze University, Jingzhou 434023, China;
3 Zhongshan Zhongchuang Technology Researh Institute of Opto-electronics Industry, Zhongshan 528415, China;
4 Key Laboratory Optoelectronic Sensing Integrated Application of Henan Province, School of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453007, China

收稿日期:2018-06-23 修回日期:2018-08-11 出版日期:2018-10-05 发布日期:2018-10-05
通讯作者: Jianghua Luo E-mail:87585705@qq.com
基金资助:
Project supported by the Key Science and Technology Research of Henan Province, China (Grant Nos. 162102210111 and 172102310471) and the National Key Research and Development Program of China (Grant No. 2017YFB0403502).

Backward rescattered photoelectron holography in strong-field ionization

Fujun Chen(陈富军)¹, Ruxian Yao(姚汝贤)¹, Jianghua Luo(罗江华)^2,3, Changqing Wang(王长清)⁴

1 School of Information Engineering, Huanghuai University, Zhumadian 463000, China;
2 School of Physics and Optoelectronic Engineering, Yangtze University, Jingzhou 434023, China;
3 Zhongshan Zhongchuang Technology Researh Institute of Opto-electronics Industry, Zhongshan 528415, China;
4 Key Laboratory Optoelectronic Sensing Integrated Application of Henan Province, School of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453007, China

Received:2018-06-23 Revised:2018-08-11 Online:2018-10-05 Published:2018-10-05
Contact: Jianghua Luo E-mail:87585705@qq.com
Supported by:
Project supported by the Key Science and Technology Research of Henan Province, China (Grant Nos. 162102210111 and 172102310471) and the National Key Research and Development Program of China (Grant No. 2017YFB0403502).

摘要/Abstract

摘要：

By numerically solving the time-dependent Schrödinger equation, we observe a remarkable strong-field interference pattern in the photoelectron momentum distribution of a hydrogen atom ionized by a few-cycles laser pulse. This interference pattern is joined together with the familiar near-forward strong-field photoelectron holographic interference. By applying the strong-field approximation theory, we investigate the formation of this interference pattern, which arises from the interference between the backward rescattered part and the direct part of the tunneling ionized electron wave packet. We demonstrate that this backward rescattered photoelectron holographic interference can also be observed in a more realistic parallel two-color laser field. These results pave a new way to look into the atomic and molecular structure with ultrafast timescale.

关键词: femtosecond physics, strong-field ionization, photoelectron holography

Abstract:

Key words: femtosecond physics, strong-field ionization, photoelectron holography

中图分类号: (Multiphoton ionization and excitation to highly excited states)

32.80.Rm

42.50.Hz (Strong-field excitation of optical transitions in quantum systems; multiphoton processes; dynamic Stark shift) 32.80.Fb (Photoionization of atoms and ions)

陈富军, 姚汝贤, 罗江华, 王长清. Backward rescattered photoelectron holography in strong-field ionization[J]. 中国物理B, 2018, 27(10): 103202-103202.

Fujun Chen(陈富军), Ruxian Yao(姚汝贤), Jianghua Luo(罗江华), Changqing Wang(王长清). Backward rescattered photoelectron holography in strong-field ionization[J]. Chin. Phys. B, 2018, 27(10): 103202-103202.

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Backward rescattered photoelectron holography in strong-field ionization

Backward rescattered photoelectron holography in strong-field ionization

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