中国物理B ›› 2017, Vol. 26 ›› Issue (6): 68104-068104.doi: 10.1088/1674-1056/26/6/068104

• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇    下一篇

Magnesium incorporation efficiencies in MgxZn1-xO films on ZnO substrates grown by metalorganic chemical vapor deposition

Qi-Chang Hu(胡启昌), Kai Ding(丁凯)   

  1. 1 College of Mechanical and Electronic Engineering, Fujian Agriculture and Forestry University, Fuzhou 350002, China;
    2 Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, China
  • 收稿日期:2016-10-31 修回日期:2017-03-04 出版日期:2017-06-05 发布日期:2017-06-05
  • 通讯作者: Kai Ding E-mail:kding@fjirsm.ac.cn
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 61474121) and the Major Scientific Project of Fujian Province, China (Grant No. 2014NZ0002-2).

Magnesium incorporation efficiencies in MgxZn1-xO films on ZnO substrates grown by metalorganic chemical vapor deposition

Qi-Chang Hu(胡启昌)1, Kai Ding(丁凯)2   

  1. 1 College of Mechanical and Electronic Engineering, Fujian Agriculture and Forestry University, Fuzhou 350002, China;
    2 Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, China
  • Received:2016-10-31 Revised:2017-03-04 Online:2017-06-05 Published:2017-06-05
  • Contact: Kai Ding E-mail:kding@fjirsm.ac.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 61474121) and the Major Scientific Project of Fujian Province, China (Grant No. 2014NZ0002-2).

摘要: We investigate the magnesium (Mg) incorporation efficiencies in MgxZn1-xO films on c-plane Zn-face ZnO substrates by using metalorganic chemical vapor deposition (MOCVD) technique. In order to deposit high quality MgxZn1-xO films, atomically smooth epi-ready surfaces of the hydrothermal grown ZnO substrates are achieved by thermal annealing in O2 atmosphere and characterized by atomic force microscope (AFM). The AFM, scanning electron microscope (SEM), and x-ray diffraction (XRD) studies demonstrate that the MgxZn1-xO films each have flat surface and hexagonal wurtzite structure without phase segregation at up to Mg content of 34.4%. The effects of the growth parameters including substrate temperature, reactor pressure and VI/II ratio on Mg content in the films are investigated by XRD analysis based on Vegard's law, and confirmed by photo-luminescence spectra and x-ray photoelectron spectroscopy as well. It is indicated that high substrate temperature, low reactor pressure, and high VI/II ratio are good for obtaining high Mg content.

关键词: MgxZn1-xO, MOCVD, incorporation efficiency, ZnO bulk crystal

Abstract: We investigate the magnesium (Mg) incorporation efficiencies in MgxZn1-xO films on c-plane Zn-face ZnO substrates by using metalorganic chemical vapor deposition (MOCVD) technique. In order to deposit high quality MgxZn1-xO films, atomically smooth epi-ready surfaces of the hydrothermal grown ZnO substrates are achieved by thermal annealing in O2 atmosphere and characterized by atomic force microscope (AFM). The AFM, scanning electron microscope (SEM), and x-ray diffraction (XRD) studies demonstrate that the MgxZn1-xO films each have flat surface and hexagonal wurtzite structure without phase segregation at up to Mg content of 34.4%. The effects of the growth parameters including substrate temperature, reactor pressure and VI/II ratio on Mg content in the films are investigated by XRD analysis based on Vegard's law, and confirmed by photo-luminescence spectra and x-ray photoelectron spectroscopy as well. It is indicated that high substrate temperature, low reactor pressure, and high VI/II ratio are good for obtaining high Mg content.

Key words: MgxZn1-xO, MOCVD, incorporation efficiency, ZnO bulk crystal

中图分类号:  (Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.))

  • 81.15.Gh
68.37.-d (Microscopy of surfaces, interfaces, and thin films) 71.55.Gs (II-VI semiconductors)