中国物理B ›› 2017, Vol. 26 ›› Issue (12): 124201-124201.doi: 10.1088/1674-1056/26/12/124201

• ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS • 上一篇    下一篇

Error analysis and Stokes parameter measurement of rotating quarter-wave plate polarimeter

Dan-Dan Zhi(支丹丹), Jian-Jun Li(李健军), Dong-Yang Gao(高冬阳), Wen-Chao Zhai(翟文超), Xiong-Hao Huang(黄雄豪), Xiao-Bing Zheng(郑小兵)   

  1. 1. Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Key Laboratory of Optical Calibration and Characterization, Hefei 230031, China;
    2. University of Science and Technology of China, Hefei 230026, China
  • 收稿日期:2017-06-10 修回日期:2017-07-19 出版日期:2017-12-05 发布日期:2017-12-05
  • 通讯作者: Xiao-Bing Zheng E-mail:xbzheng@aiofm.ac.cn
  • 基金资助:
    Project supported by the National High Technology Research and Development Program of China (Grant No. 2015AA123702) and the National Natural Science Foundation of China (Grant No. 61505222).

Error analysis and Stokes parameter measurement of rotating quarter-wave plate polarimeter

Dan-Dan Zhi(支丹丹)1,2, Jian-Jun Li(李健军)1, Dong-Yang Gao(高冬阳)1,2, Wen-Chao Zhai(翟文超)1, Xiong-Hao Huang(黄雄豪)1,2, Xiao-Bing Zheng(郑小兵)1   

  1. 1. Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Key Laboratory of Optical Calibration and Characterization, Hefei 230031, China;
    2. University of Science and Technology of China, Hefei 230026, China
  • Received:2017-06-10 Revised:2017-07-19 Online:2017-12-05 Published:2017-12-05
  • Contact: Xiao-Bing Zheng E-mail:xbzheng@aiofm.ac.cn
  • Supported by:
    Project supported by the National High Technology Research and Development Program of China (Grant No. 2015AA123702) and the National Natural Science Foundation of China (Grant No. 61505222).

RichHTML

0

PDF (PC)

488

赞

摘要： In this paper, we present a simple Stokes parameter measurement method for a rotating quarter-wave plate polarimeter. This method is used to construct a model to describe the principle of how the magnitudes of errors influence the deviation of the output light Stokes parameter, on the basis of accuracy analysis of the retardance error of the quarter-wave plate, the misalignment of the analyzing polarizer, and the phase shift of the measured signals, which will help us to determine the magnitudes of these errors and then to acquire the correct results of Stokes parameters. The method is validated by the experiments on left-handed circularly polarized and linear horizontal polarization beams. With the improved method, the maximum measurement deviations of Stokes parameters for these two different polarized states are reduced from 2.72% to 2.68%, and from 3.83% to 1.06% respectively. Our results demonstrate that the proposed method can be used as a promising approach to Stokes parameter measurement for a rotating quarter-wave plate polarimeter.

关键词: polarization, stokes parameter detection, polarimeter

Abstract: In this paper, we present a simple Stokes parameter measurement method for a rotating quarter-wave plate polarimeter. This method is used to construct a model to describe the principle of how the magnitudes of errors influence the deviation of the output light Stokes parameter, on the basis of accuracy analysis of the retardance error of the quarter-wave plate, the misalignment of the analyzing polarizer, and the phase shift of the measured signals, which will help us to determine the magnitudes of these errors and then to acquire the correct results of Stokes parameters. The method is validated by the experiments on left-handed circularly polarized and linear horizontal polarization beams. With the improved method, the maximum measurement deviations of Stokes parameters for these two different polarized states are reduced from 2.72% to 2.68%, and from 3.83% to 1.06% respectively. Our results demonstrate that the proposed method can be used as a promising approach to Stokes parameter measurement for a rotating quarter-wave plate polarimeter.

Key words: polarization, stokes parameter detection, polarimeter

中图分类号:  (Wave optics)

  • 42.25.-p
42.25.Ja (Polarization) 42.79.Pw (Imaging detectors and sensors)